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Book
A practical guide to transmission electron microscopy.
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ISBN: 1606509187 9781606509180 9781606509173 Year: 2016 Publisher: New York [New York] (222 East 46th Street, New York, NY 10017)

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Abstract

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.


Book
A practical guide to transmission electron microscopy : fundamentals
Author:
ISBN: 1606507044 9781606507032 1606507036 9781606507049 Year: 2016 Publisher: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press,

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Abstract

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.


Book
Advances in Transmission Electron Microscopy for the Study of Soft and Hard Matter
Author:
Year: 2022 Publisher: Basel MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

This book provides readers with some examples of advanced applications of electron microscopy on organic and inorganic specimens, highlighting out how new original approaches could provide a deeper understanding of the properties of matter and how a transmission electron microscope is not only a microscope but also a flexible tool for tailoring experiments, properly suited, to the issue of interest.


Book
Advances in Transmission Electron Microscopy for the Study of Soft and Hard Matter
Author:
Year: 2022 Publisher: Basel MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

This book provides readers with some examples of advanced applications of electron microscopy on organic and inorganic specimens, highlighting out how new original approaches could provide a deeper understanding of the properties of matter and how a transmission electron microscope is not only a microscope but also a flexible tool for tailoring experiments, properly suited, to the issue of interest.


Book
Advances in Transmission Electron Microscopy for the Study of Soft and Hard Matter
Author:
Year: 2022 Publisher: Basel MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

This book provides readers with some examples of advanced applications of electron microscopy on organic and inorganic specimens, highlighting out how new original approaches could provide a deeper understanding of the properties of matter and how a transmission electron microscope is not only a microscope but also a flexible tool for tailoring experiments, properly suited, to the issue of interest.

Keywords

Technology: general issues --- History of engineering & technology --- Materials science --- scanning transmission electron microscopy (STEM) --- electron tomography (ET) --- sparse imaging --- inpainting reconstruction --- biological samples --- Trypanosoma brucei --- TEM --- in-line holography --- single particle imaging --- atomic resolution imaging --- radiation damage --- soft matter --- nanostructured drugs --- organic materials --- holography --- electron holography --- diffraction --- coherent diffraction imaging --- iterative phase retrieval --- biomolecules --- propionic acid --- autophagy --- mitophagy --- correlative light and electron microscopy (CLEM) --- amorphous silica --- powder diffraction --- transmission electron microscopy --- high-resolution --- spectroscopy --- electron diffraction --- electron pair distribution function --- magnetic nanoparticles --- magnetic hyperthermia --- EMCD --- EELS --- magnetism --- acceleration voltage --- scanning transmission electron microscopy (STEM) --- electron tomography (ET) --- sparse imaging --- inpainting reconstruction --- biological samples --- Trypanosoma brucei --- TEM --- in-line holography --- single particle imaging --- atomic resolution imaging --- radiation damage --- soft matter --- nanostructured drugs --- organic materials --- holography --- electron holography --- diffraction --- coherent diffraction imaging --- iterative phase retrieval --- biomolecules --- propionic acid --- autophagy --- mitophagy --- correlative light and electron microscopy (CLEM) --- amorphous silica --- powder diffraction --- transmission electron microscopy --- high-resolution --- spectroscopy --- electron diffraction --- electron pair distribution function --- magnetic nanoparticles --- magnetic hyperthermia --- EMCD --- EELS --- magnetism --- acceleration voltage

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