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In 1978, Fred Hoyle proposed that interstellar comets carrying several viruses landed on Earth as part of the panspermia hypotheses. With respect to life, the origin of homochirality on Earth has been the greatest mystery because life cannot exist without molecular asymmetry. Many scientists have proposed several possible hypotheses to answer this long-standing L-D question. Previously, Martin Gardner raised the question about mirror symmetry and broken mirror symmetry in terms of the homochirality question in his monographs (1964 and 1990). Possible scenarios for the L-D issue can be categorized into (i) Earth and exoterrestrial origins, (ii) by-chance and necessity mechanisms, and (iii) mirror-symmetrical and non-mirror-symmetrical forces as physical and chemical origins. These scenarios should involve further great amplification mechanisms, enabling a pure L- or D-world.
supramolecular assembly --- weak neutral current --- homochiral and heterochiral aggregates --- vortex --- neutrinos --- Soai reaction --- Viedma ripening effect --- nucleus–molecular coupling --- absolute asymmetric synthesis --- circular dichroism --- enantiomer self-disproportionation --- magmatic flow --- metal-organic framework --- Z0 boson --- hidden chirality --- gravitation --- SDE --- etch figures --- replicators --- supramolecular chirality --- deracemization --- assemblies --- spin polarized electrons --- super-high-velocity impact --- homochirality --- chirogenesis --- heat capacity --- tunneling --- prebiotic --- Salam hypothesis --- tilt-chirality --- self-assembly --- racemic field --- triethylenediamine (DABCO) molecules --- environmental chirality --- bioorganic homochirality --- polymer --- enantioselective reaction --- two-fold helix --- origin of life --- biological homochirality --- parity violation in the weak interaction --- amino acids --- multi-point approximation --- magnetism --- C1- and C2-symmetric catalysts --- spin-polarized lepton --- lipid --- chiral field (memory) --- Wallach’s rule --- asymmetric autocatalysis --- plasma reactor --- circularly polarized photon --- asymmetric reaction --- racemate --- enantiomorphism --- symmetry breaking --- ?-strand --- chirality --- circularly polarized light --- circularly polarized luminescence --- autocatalysis --- amino acid handedness --- asymmetric synthesis --- precision measurement --- nepheline --- chiral separation --- parity violation --- achiral stationary phase --- genesis of life chirality --- high dimensional chirality
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Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.
Technology: general issues --- History of engineering & technology --- white light interference --- laser interference --- surface positioning --- end-plate surface distance measurement --- spherical diamond wheel --- diamond roller --- form truing --- in-situ measurements --- topography measurement --- differential measurement system --- modular design --- confocal sensor --- film interferometry --- over-constrained mechanism --- geometric deviations --- multi-tasking machine tools --- identification method --- squareness of translational axes --- metrology --- step gauge --- length calibration --- multi-path laser synthesis technology --- measurement mechanism --- machine tool --- surface shape contour --- on-site measurement --- positional relation --- scanless 3D imaging --- compressed sensing --- depth detection --- single-pixel detector --- blade tip timing --- circumferential Fourier fit --- synchronous vibration --- optical angle sensor --- mode-locked femtosecond laser --- optical frequency comb --- laser autocollimation --- diffraction grating --- absolute angle measurement --- nonlinear optics --- second harmonic generation --- aeroengine blade --- blade twist --- measurement and evaluation --- a priori planning --- geometric analysis --- automated optical inspection --- precision measurement --- circular contour --- edge detection --- measurement system analysis --- coordinate measuring machine --- reproducibility --- GD& --- T --- quality --- measurement uncertainty --- precision metrology --- form measurement --- stitching linear-scan method --- roundness measurement --- Monte Carlo method --- single point diamond tool --- cutting edge radius --- reversal method --- nanoindentation system --- elastic recovery --- surface charge distribution --- point probing characteristics --- spherical scattering electrical field probe --- miniature internal structures --- high aspect ratios --- circulating cooling water --- dynamic thermal filtering --- precision manufacturing --- quick response --- temperature stability --- thermal management --- dual-axis level --- light refraction --- light transmission --- angle measurement --- differential Fabry–Pérot interferometer --- homodyne interferometer --- nonlinearity error --- linear displacement --- chromatic confocal probe --- femtosecond laser --- off-axis differential method --- tracking local minimum method --- laser triangulation displacement sensor (LTDS) --- dispensing robot --- location system --- actual laser imaging waveform --- centroid difference --- repeatability accuracy --- dynamic response speed --- absolute distance measurement --- system error correction --- surface texture measurement --- confocal sensing --- surface form tracing --- 3D reconstruction --- roughness --- in-process --- metrology for machining --- optical coherence tomography --- wafer die --- defect detection --- generative adversarial network (GAN) --- you only look once version 3 (YOLOv3) --- pad dressing --- dynamic measurement --- CMP --- pad uniformity --- pad lifetime --- n/a --- differential Fabry-Pérot interferometer
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Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.
white light interference --- laser interference --- surface positioning --- end-plate surface distance measurement --- spherical diamond wheel --- diamond roller --- form truing --- in-situ measurements --- topography measurement --- differential measurement system --- modular design --- confocal sensor --- film interferometry --- over-constrained mechanism --- geometric deviations --- multi-tasking machine tools --- identification method --- squareness of translational axes --- metrology --- step gauge --- length calibration --- multi-path laser synthesis technology --- measurement mechanism --- machine tool --- surface shape contour --- on-site measurement --- positional relation --- scanless 3D imaging --- compressed sensing --- depth detection --- single-pixel detector --- blade tip timing --- circumferential Fourier fit --- synchronous vibration --- optical angle sensor --- mode-locked femtosecond laser --- optical frequency comb --- laser autocollimation --- diffraction grating --- absolute angle measurement --- nonlinear optics --- second harmonic generation --- aeroengine blade --- blade twist --- measurement and evaluation --- a priori planning --- geometric analysis --- automated optical inspection --- precision measurement --- circular contour --- edge detection --- measurement system analysis --- coordinate measuring machine --- reproducibility --- GD& --- T --- quality --- measurement uncertainty --- precision metrology --- form measurement --- stitching linear-scan method --- roundness measurement --- Monte Carlo method --- single point diamond tool --- cutting edge radius --- reversal method --- nanoindentation system --- elastic recovery --- surface charge distribution --- point probing characteristics --- spherical scattering electrical field probe --- miniature internal structures --- high aspect ratios --- circulating cooling water --- dynamic thermal filtering --- precision manufacturing --- quick response --- temperature stability --- thermal management --- dual-axis level --- light refraction --- light transmission --- angle measurement --- differential Fabry–Pérot interferometer --- homodyne interferometer --- nonlinearity error --- linear displacement --- chromatic confocal probe --- femtosecond laser --- off-axis differential method --- tracking local minimum method --- laser triangulation displacement sensor (LTDS) --- dispensing robot --- location system --- actual laser imaging waveform --- centroid difference --- repeatability accuracy --- dynamic response speed --- absolute distance measurement --- system error correction --- surface texture measurement --- confocal sensing --- surface form tracing --- 3D reconstruction --- roughness --- in-process --- metrology for machining --- optical coherence tomography --- wafer die --- defect detection --- generative adversarial network (GAN) --- you only look once version 3 (YOLOv3) --- pad dressing --- dynamic measurement --- CMP --- pad uniformity --- pad lifetime --- n/a --- differential Fabry-Pérot interferometer
Choose an application
Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.
Technology: general issues --- History of engineering & technology --- white light interference --- laser interference --- surface positioning --- end-plate surface distance measurement --- spherical diamond wheel --- diamond roller --- form truing --- in-situ measurements --- topography measurement --- differential measurement system --- modular design --- confocal sensor --- film interferometry --- over-constrained mechanism --- geometric deviations --- multi-tasking machine tools --- identification method --- squareness of translational axes --- metrology --- step gauge --- length calibration --- multi-path laser synthesis technology --- measurement mechanism --- machine tool --- surface shape contour --- on-site measurement --- positional relation --- scanless 3D imaging --- compressed sensing --- depth detection --- single-pixel detector --- blade tip timing --- circumferential Fourier fit --- synchronous vibration --- optical angle sensor --- mode-locked femtosecond laser --- optical frequency comb --- laser autocollimation --- diffraction grating --- absolute angle measurement --- nonlinear optics --- second harmonic generation --- aeroengine blade --- blade twist --- measurement and evaluation --- a priori planning --- geometric analysis --- automated optical inspection --- precision measurement --- circular contour --- edge detection --- measurement system analysis --- coordinate measuring machine --- reproducibility --- GD& --- T --- quality --- measurement uncertainty --- precision metrology --- form measurement --- stitching linear-scan method --- roundness measurement --- Monte Carlo method --- single point diamond tool --- cutting edge radius --- reversal method --- nanoindentation system --- elastic recovery --- surface charge distribution --- point probing characteristics --- spherical scattering electrical field probe --- miniature internal structures --- high aspect ratios --- circulating cooling water --- dynamic thermal filtering --- precision manufacturing --- quick response --- temperature stability --- thermal management --- dual-axis level --- light refraction --- light transmission --- angle measurement --- differential Fabry-Pérot interferometer --- homodyne interferometer --- nonlinearity error --- linear displacement --- chromatic confocal probe --- femtosecond laser --- off-axis differential method --- tracking local minimum method --- laser triangulation displacement sensor (LTDS) --- dispensing robot --- location system --- actual laser imaging waveform --- centroid difference --- repeatability accuracy --- dynamic response speed --- absolute distance measurement --- system error correction --- surface texture measurement --- confocal sensing --- surface form tracing --- 3D reconstruction --- roughness --- in-process --- metrology for machining --- optical coherence tomography --- wafer die --- defect detection --- generative adversarial network (GAN) --- you only look once version 3 (YOLOv3) --- pad dressing --- dynamic measurement --- CMP --- pad uniformity --- pad lifetime
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