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ISBN: 0408710578 Year: 1984 Publisher: London : Butterworths,
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Year: 1970 Publisher: London : Royal society,
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ISBN: 9780128045237 012804523X 0128045221 9780128045220 Year: 2020 Publisher: Amsterdam, The Netherlands ; Oxford, England ; Cambridge, Massachusetts : Elsevier,
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ISBN: 1627053077 0750327839 1627053069 Year: 2015 Publisher: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : Morgan & Claypool Publishers, IOP Publishing,
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This book introduces the reader to the concepts and instrumentation that emerge in an experimental approach to the photoemission process. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. This book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.
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Year: 1982 Publisher: Washington, [D.C.] : U.S. Dept. of Commerce, National Bureau of Standards,
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Photoelectron spectroscopy. --- Photoionization. --- Ionization.
ISBN: 0841206392 9780841206397 Year: 1981 Publisher: Washington: American chemical society,
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ISBN: 0841208328 Year: 1981 Publisher: Washington, District of Columbia : American Chemical Society,
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Year: 1982 Publisher: Washington, [D.C.] : U.S. Dept. of Commerce, National Bureau of Standards,
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Photoelectron spectroscopy. --- Photoionization. --- Ionization.
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ISBN: 9780080451459 0080451454 1281096113 9781281096111 9786611096113 6611096116 0080555896 9780080555898 Year: 2008 Publisher: Oxford, UK ; Boston : Elsevier,
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Interfaces of solid materials play an increasingly important role when the size of active elements used in different areas of science and technology shrinks to the nanometer range. This has required development of analytical tools specifically sensitive to the properties of a material in the vicinity of its boundary with other phase (a heterojunction). The present book is the first to describe the basics of internal photoemission spectroscopy - a method based on the detection of electron transitions from one solid to another. This spectroscopy combines the interface sensitivity typical of conv
Photoelectron spectroscopy. --- Photoemission. --- Semiconductors --- Junctions.
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PHOTOELECTRON SPECTROSCOPY --- ELECTRIC CONDUCTIVITY --- X-RAY
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