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Electronics --- elektronica --- Electronics. --- Voltage amplifiers --- Thyristors --- Transistors --- Fet circuits --- Operational amplifier --- Oscillators --- Power amplifiers --- Emitter follower --- Diodes --- Semi-conductors
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This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
Technology: general issues --- History of engineering & technology --- 3D-IC (three-dimensional integrated circuit) --- electromagnetic interference --- near field measurement --- SAC305 --- BGA --- low temperature --- fracture failure --- factorial design of experiment --- genetic algorithm optimization --- return loss --- multiple-input multiple-output (MIMO) --- single event effects --- linear energy transfer --- Monte Carlo simulation --- radiation hardness --- pressureless sintered micron silver joints --- deep space environment --- extreme thermal shocks --- reconstruction --- simulation --- elastic mechanical properties --- state of health --- remaining useful life --- electrochemistry based electrical model --- semi-empirical capacity fading model --- useful life distribution --- quality and reliability assurance --- single event effect --- microdosimetry --- lineal energy --- deconvolution --- gamma process --- lifetime --- measurement system analysis --- reliability estimation --- GaN --- operational amplifier --- proton therapy --- prompt gamma imaging --- 3D X-ray --- bias temperature-humidity reliability test --- conductive anodic filament (CAF) --- de-penalization --- finite element analysis --- 3D-IC (three-dimensional integrated circuit) --- electromagnetic interference --- near field measurement --- SAC305 --- BGA --- low temperature --- fracture failure --- factorial design of experiment --- genetic algorithm optimization --- return loss --- multiple-input multiple-output (MIMO) --- single event effects --- linear energy transfer --- Monte Carlo simulation --- radiation hardness --- pressureless sintered micron silver joints --- deep space environment --- extreme thermal shocks --- reconstruction --- simulation --- elastic mechanical properties --- state of health --- remaining useful life --- electrochemistry based electrical model --- semi-empirical capacity fading model --- useful life distribution --- quality and reliability assurance --- single event effect --- microdosimetry --- lineal energy --- deconvolution --- gamma process --- lifetime --- measurement system analysis --- reliability estimation --- GaN --- operational amplifier --- proton therapy --- prompt gamma imaging --- 3D X-ray --- bias temperature-humidity reliability test --- conductive anodic filament (CAF) --- de-penalization --- finite element analysis
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This Special Issue focuses on the state-of-the-art results from the definition and design of filters for low- and high-frequency applications and systems. Different technologies and solutions are commonly adopted for filter definition, from electrical to electromechanical and mechanical solutions, from passive to active devices, and from hybrid to integrated designs. Aspects related to both theoretical and experimental research in filter design, CAD modeling and novel technologies and applications, as well as filter fabrication, characterization and testing, are covered. The proposed research articles deal with different topics as follows: Modeling, design and simulation of filters; Processes and fabrication technologies for filters; Automated characterization and test of filters; Voltage and current mode filters; Integrated and discrete filters; Passive and active filters; Variable filters, characterization and tunability.
History of engineering & technology --- analogue-to-digital conversion --- ATHOS soft X-ray beamline --- broadband noise --- Hall probe --- offset fluctuation and drift --- three-axis teslameter --- undulator --- power line communication (PLC) --- conducted disturbances --- anti-interference filter --- smart home --- low-pass filter (LPF) --- stepped impedance resonator (SIR) --- hairpin resonator --- internal coupling --- defected ground structure (DGS) --- current mode --- universal filter --- VCII --- voltage conveyor --- SIMO filter --- microwave dielectric ceramics --- filter --- additive manufacturing --- digital light processing --- post annealing --- dielectric properties --- wideband --- bandpass filter --- quarter wavelength --- stepped-impedance resonator (SIR) --- ultra-wideband --- stub-loaded --- stepped impedance resonator --- active filters --- anti-aliasing filters --- HBT --- inductorless --- low-pass filters --- SiGe --- switched-capacitor filters --- low-voltage --- finFET --- operational amplifier --- voltage-controlled oscillator --- unity-gain bandwidth --- varactor --- total harmonic distortion --- phase noise --- active inductor --- MMIC --- tunable filters --- analogue-to-digital conversion --- ATHOS soft X-ray beamline --- broadband noise --- Hall probe --- offset fluctuation and drift --- three-axis teslameter --- undulator --- power line communication (PLC) --- conducted disturbances --- anti-interference filter --- smart home --- low-pass filter (LPF) --- stepped impedance resonator (SIR) --- hairpin resonator --- internal coupling --- defected ground structure (DGS) --- current mode --- universal filter --- VCII --- voltage conveyor --- SIMO filter --- microwave dielectric ceramics --- filter --- additive manufacturing --- digital light processing --- post annealing --- dielectric properties --- wideband --- bandpass filter --- quarter wavelength --- stepped-impedance resonator (SIR) --- ultra-wideband --- stub-loaded --- stepped impedance resonator --- active filters --- anti-aliasing filters --- HBT --- inductorless --- low-pass filters --- SiGe --- switched-capacitor filters --- low-voltage --- finFET --- operational amplifier --- voltage-controlled oscillator --- unity-gain bandwidth --- varactor --- total harmonic distortion --- phase noise --- active inductor --- MMIC --- tunable filters
Choose an application
This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
Technology: general issues --- History of engineering & technology --- 3D-IC (three-dimensional integrated circuit) --- electromagnetic interference --- near field measurement --- SAC305 --- BGA --- low temperature --- fracture failure --- factorial design of experiment --- genetic algorithm optimization --- return loss --- multiple-input multiple-output (MIMO) --- single event effects --- linear energy transfer --- Monte Carlo simulation --- radiation hardness --- pressureless sintered micron silver joints --- deep space environment --- extreme thermal shocks --- reconstruction --- simulation --- elastic mechanical properties --- state of health --- remaining useful life --- electrochemistry based electrical model --- semi-empirical capacity fading model --- useful life distribution --- quality and reliability assurance --- single event effect --- microdosimetry --- lineal energy --- deconvolution --- gamma process --- lifetime --- measurement system analysis --- reliability estimation --- GaN --- operational amplifier --- proton therapy --- prompt gamma imaging --- 3D X-ray --- bias temperature-humidity reliability test --- conductive anodic filament (CAF) --- de-penalization --- finite element analysis --- n/a
Choose an application
This Special Issue focuses on the state-of-the-art results from the definition and design of filters for low- and high-frequency applications and systems. Different technologies and solutions are commonly adopted for filter definition, from electrical to electromechanical and mechanical solutions, from passive to active devices, and from hybrid to integrated designs. Aspects related to both theoretical and experimental research in filter design, CAD modeling and novel technologies and applications, as well as filter fabrication, characterization and testing, are covered. The proposed research articles deal with different topics as follows: Modeling, design and simulation of filters; Processes and fabrication technologies for filters; Automated characterization and test of filters; Voltage and current mode filters; Integrated and discrete filters; Passive and active filters; Variable filters, characterization and tunability.
History of engineering & technology --- analogue-to-digital conversion --- ATHOS soft X-ray beamline --- broadband noise --- Hall probe --- offset fluctuation and drift --- three-axis teslameter --- undulator --- power line communication (PLC) --- conducted disturbances --- anti-interference filter --- smart home --- low-pass filter (LPF) --- stepped impedance resonator (SIR) --- hairpin resonator --- internal coupling --- defected ground structure (DGS) --- current mode --- universal filter --- VCII --- voltage conveyor --- SIMO filter --- microwave dielectric ceramics --- filter --- additive manufacturing --- digital light processing --- post annealing --- dielectric properties --- wideband --- bandpass filter --- quarter wavelength --- stepped-impedance resonator (SIR) --- ultra-wideband --- stub-loaded --- stepped impedance resonator --- active filters --- anti-aliasing filters --- HBT --- inductorless --- low-pass filters --- SiGe --- switched-capacitor filters --- low-voltage --- finFET --- operational amplifier --- voltage-controlled oscillator --- unity-gain bandwidth --- varactor --- total harmonic distortion --- phase noise --- active inductor --- MMIC --- tunable filters
Choose an application
This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
3D-IC (three-dimensional integrated circuit) --- electromagnetic interference --- near field measurement --- SAC305 --- BGA --- low temperature --- fracture failure --- factorial design of experiment --- genetic algorithm optimization --- return loss --- multiple-input multiple-output (MIMO) --- single event effects --- linear energy transfer --- Monte Carlo simulation --- radiation hardness --- pressureless sintered micron silver joints --- deep space environment --- extreme thermal shocks --- reconstruction --- simulation --- elastic mechanical properties --- state of health --- remaining useful life --- electrochemistry based electrical model --- semi-empirical capacity fading model --- useful life distribution --- quality and reliability assurance --- single event effect --- microdosimetry --- lineal energy --- deconvolution --- gamma process --- lifetime --- measurement system analysis --- reliability estimation --- GaN --- operational amplifier --- proton therapy --- prompt gamma imaging --- 3D X-ray --- bias temperature-humidity reliability test --- conductive anodic filament (CAF) --- de-penalization --- finite element analysis --- n/a
Choose an application
This Special Issue focuses on the state-of-the-art results from the definition and design of filters for low- and high-frequency applications and systems. Different technologies and solutions are commonly adopted for filter definition, from electrical to electromechanical and mechanical solutions, from passive to active devices, and from hybrid to integrated designs. Aspects related to both theoretical and experimental research in filter design, CAD modeling and novel technologies and applications, as well as filter fabrication, characterization and testing, are covered. The proposed research articles deal with different topics as follows: Modeling, design and simulation of filters; Processes and fabrication technologies for filters; Automated characterization and test of filters; Voltage and current mode filters; Integrated and discrete filters; Passive and active filters; Variable filters, characterization and tunability.
analogue-to-digital conversion --- ATHOS soft X-ray beamline --- broadband noise --- Hall probe --- offset fluctuation and drift --- three-axis teslameter --- undulator --- power line communication (PLC) --- conducted disturbances --- anti-interference filter --- smart home --- low-pass filter (LPF) --- stepped impedance resonator (SIR) --- hairpin resonator --- internal coupling --- defected ground structure (DGS) --- current mode --- universal filter --- VCII --- voltage conveyor --- SIMO filter --- microwave dielectric ceramics --- filter --- additive manufacturing --- digital light processing --- post annealing --- dielectric properties --- wideband --- bandpass filter --- quarter wavelength --- stepped-impedance resonator (SIR) --- ultra-wideband --- stub-loaded --- stepped impedance resonator --- active filters --- anti-aliasing filters --- HBT --- inductorless --- low-pass filters --- SiGe --- switched-capacitor filters --- low-voltage --- finFET --- operational amplifier --- voltage-controlled oscillator --- unity-gain bandwidth --- varactor --- total harmonic distortion --- phase noise --- active inductor --- MMIC --- tunable filters
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