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Auger effect --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Auger effect.

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Auger [Effet d' ] --- Auger effect --- Auger-effect --- 543.42 --- Metals --- -538.97 --- Metallic elements --- Chemical elements --- Ores --- Metallurgy --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- Spectra --- Special geometry and interaction with particles and radiation --- 538.97 Special geometry and interaction with particles and radiation --- 543.42 Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 538.97 --- Monograph

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The interaction of ionising radiation with atomic and/or molecular ions is a fundamental process in nature, with implications for the understanding of many laboratory and astrophysical plasmas. At short wavelengths, the photon–ion interactions lead to inner-shell and multiple electron excitations, leading to demands on appropriate laboratory developments of sources and detectors and requiring advanced theoretical treatments which take into account many-body electron-correlation effects. This book includes a range of papers based on different short wavelength photon sources including recent facility and instrumental developments. Topics include experimental photoabsorption studies with laser-produced plasmas and photoionization of atomic and molecular ions with synchrotron and FEL sources, including modifications of a cylindrical mirror analyzer for high efficiency photoelectron spectroscopy on ion beams. Theoretical investigations include the effects of FEL fluctuations on autoionization line shapes, multiple sequential ionization by intense fs XUV pulses, photoelectron angular distributions for non-resonant two-photon ionization, inner-shell photodetachment of Na- and spin-polarized fluxes from fullerene anions.

Research & information: general --- 2s2p --- Lithium-ion --- auto-ionization --- free electron laser --- stochastic average --- time dependent density matrix --- photoionization --- multiple ionization --- many-electron processes --- absolute cross sections --- synchrotron radiation --- collisional-radiative model --- laser-produced plasma, ion distribution --- ionization bottleneck --- radiative recombination --- collisional ioniztion --- three-body recombination --- nonlinear photoionization --- nonlinear interaction --- Cooper minimum --- angular distributions --- atomic ions --- dual-laser plasma technique --- photodetachment --- inner-shell phenomena --- electron spectroscopy --- ion beam --- spin-polarization --- fullerene anions --- endohedral fullerene anions --- NH+ --- molecular ion --- K-shell --- merged-beam --- Pb-Sn alloys --- EUV emission of high Z materials --- collisional radiative model --- Cowan suite of Codes --- ions --- free-electron laser --- krypton --- femtosecond pulses --- photoelectron spectroscopy --- atomic data --- inner-shell photoionization --- atomic nitrogen ion --- 2s2p --- Lithium-ion --- auto-ionization --- free electron laser --- stochastic average --- time dependent density matrix --- photoionization --- multiple ionization --- many-electron processes --- absolute cross sections --- synchrotron radiation --- collisional-radiative model --- laser-produced plasma, ion distribution --- ionization bottleneck --- radiative recombination --- collisional ioniztion --- three-body recombination --- nonlinear photoionization --- nonlinear interaction --- Cooper minimum --- angular distributions --- atomic ions --- dual-laser plasma technique --- photodetachment --- inner-shell phenomena --- electron spectroscopy --- ion beam --- spin-polarization --- fullerene anions --- endohedral fullerene anions --- NH+ --- molecular ion --- K-shell --- merged-beam --- Pb-Sn alloys --- EUV emission of high Z materials --- collisional radiative model --- Cowan suite of Codes --- ions --- free-electron laser --- krypton --- femtosecond pulses --- photoelectron spectroscopy --- atomic data --- inner-shell photoionization --- atomic nitrogen ion

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Materials --- Instrumental analysis --- Materiaux --- Analyse instrumentale --- Analysis --- Analyse --- -Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Chemistry, Analytic --- Chemistry, Physical and theoretical --- -Analysis --- -Chemistry, Analytic --- Engineering --- LEED --- ELECTRON SPIN RESONANCE --- MICROANALYSIS --- AUGER EFFECT --- CHROMATOGRAPHY --- SPECTROSCOPY --- INFRARED RADIATION --- Monograph --- Electron paramagnetic resonance. --- Auger effect. --- Chromatographic analysis. --- Spectrum analysis. --- Infrared radiation. --- Infra-red rays --- Infrared rays --- Radiation, Infrared --- Rays, Infrared --- Electromagnetic waves --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Analysis, Chromatographic --- Chromatography --- Phase partition --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Electron resonance --- Electron spin resonance --- EPR (Magnetic resonance) --- ESR (Magnetic resonance) --- Paramagnetic resonance, Electron --- Magnetic resonance --- Paramagnetism --- Qualitative --- -Analytical chemistry --- Spectrometry --- Analytical chemistry

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.  .

X-ray photoelectron spectroscopy. --- Auger effect. --- Auger spectroscopy --- Auto-ionization --- Autoionization --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Physics. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Materials --- Thin films. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surfaces. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Natural philosophy --- Philosophy, Natural --- Physical sciences --- Dynamics --- Surfaces --- Qualitative --- Electron spectroscopy for chemical analysis --- Photoelectron spectroscopy --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Surfaces (Physics). --- Surface chemistry --- Materials—Surfaces. --- Spectrometry --- Analytical chemistry