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X-rays --- Diffraction. --- Diffraction --- Industrial applications. --- X-rays - Diffraction. --- X-rays - Diffraction - Industrial applications.

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Collection of Simulated XRD Powder Patterns for Zeolites serves as a source of reference patterns for pure zeolite phases. The data will be helpful in establishing the structural purity of experimental phases and in indexing their diffraction patterns. The information will also aid in the determination of changes in the lattice parameters with changing composition, assessing preferred orientation effects, background evaluation, and line broadening. Also included are diffraction patterns of several common dense silicate phases to facilitate their detection in mixed phase synthesis.

X-rays --- Zeolites --- Diffraction --- Analysis --- Silicate minerals --- Analysis. --- Diffraction. --- X-rays - Diffraction --- Zeolites - Analysis

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This 5th edition of the Zeolite Powder Pattern Collection contains calculated patterns of 218 zeolite materials representing 174 framework topologies. The almost exponential growth of new zeolite topologies reflects the continued success of zeolite synthesis researchers in producing novel materials. Collection of Simulated XRD Powder Patterns for Zeolites includes materials of interest to zeolite scientists following the policies established at recent IZA conferences. The materials included have corner-sharing tetrahedral frameworks with no restrictions on chemical composition.

X-rays - Diffraction. --- X-rays -- Diffraction. --- Zeolites - Analysis. --- Zeolites - Structure. --- Zeolites. --- Zeolites --- X-rays --- Chemical Engineering --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Analysis --- Structure --- Diffraction --- Analysis. --- Structure. --- Silicate minerals

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Optics. Quantum optics --- fysicochemie --- Computer. Automation --- Chemical and physical cristallography --- Radiography, Industrial. --- X-rays --- Diffraction. --- Chemical and physical crystallography --- X-rays - Diffraction. --- X-RAY DIFFRACTION --- METALS --- MINERALS --- CERAMICS --- INDUSTRIAL CHEMICALS --- MICROSTRUCTURE --- PROPERTIES

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The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science. The audience is thus comprised of all scientists using the method: graduate students who may be starting research in this area, powder diffraction specialists, crystallographers, physicists, chemists, and materials scientists.

Rietveld method --- X-rays --- -PFSR (X-ray crystallography) --- Profile refinement (X-ray crystallography) --- Rietveld analysis --- Rietveld refinement --- Whole-pattern-fitting structure refinement (X-ray crystallography) --- Rays, Roentgen --- Roentgen rays --- Roentgenograms --- Diffraction --- -Data processing --- Rietveld method. --- X-ray crystallography --- Electromagnetic waves --- Ionizing radiation --- Radiation --- Cathode rays --- Radiography --- Vacuum-tubes --- Technique --- PFSR (X-ray crystallography) --- Diffraction&delete& --- Data processing --- fysicochemie --- Chemical and physical cristallography --- Data processing. --- Monograph --- -Rays, Roentgen --- Chemical and physical crystallography --- X-rays - Diffraction - Data processing. --- -Diffraction --- Crystal structure --- X-ray diffraction