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Materials --- Transmission electron microscopy. --- X-ray diffractometer. --- Microscopy.

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Chemical structure --- fysicochemie --- Diffractometer [X-ray ] --- X-ray diffractometer --- X-rays --- Diffraction --- Technique --- Powders --- Optical properties --- Measurement

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This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.

Materials --- Transmission electron microscopy. --- X-ray diffractometer. --- Microscopy. --- 620.18 --- Investigation of structure of materials. Metallography. Analogous study of non-metals --- 620.18 Investigation of structure of materials. Metallography. Analogous study of non-metals --- Transmission electron microscopy --- X-ray diffractometer --- Diffractometer, X-ray --- X-rays --- Electron microscopy --- Microscopy --- Equipment and supplies --- Monograph --- Spectroscopy. --- Surfaces (Physics). --- Interfaces (Physical sciences). --- Thin films. --- Solid state physics. --- Materials—Surfaces. --- Spectroscopy and Microscopy. --- Surface and Interface Science, Thin Films. --- Solid State Physics. --- Surfaces and Interfaces, Thin Films. --- Physics --- Solids --- Films, Thin --- Solid film --- Solid state electronics --- Surfaces (Technology) --- Coatings --- Thick films --- Surface chemistry --- Surfaces (Physics) --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Analytical chemistry --- Materials - Microscopy.

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’ Ronald Gronsky, University of California, Berkeley.

Materials --- Transmission electron microscopy. --- X-ray diffractometer. --- Microscopy. --- Diffractometer, X-ray --- X-rays --- Electron microscopy --- Microscopy --- Equipment and supplies --- Surfaces (Physics). --- Crystallography. --- Engineering. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Crystallography and Scattering Methods. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Engineering, general. --- Construction --- Industrial arts --- Technology --- Leptology --- Physical sciences --- Mineralogy --- Physics --- Surface chemistry --- Surfaces (Technology) --- Materials science. --- Materials—Surfaces. --- Thin films. --- Solid state physics. --- Spectroscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Qualitative --- Analytical chemistry