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2016 IEEE 34th VLSI Test Symposium (VTS)
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ISBN: 1467384550 1467384542 Year: 2016 Publisher: Piscataway : IEEE,

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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug, and repair of microelectronic circuits and systems.


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2020 IEEE Symposium on VLSI Circuits
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ISBN: 1728199425 1728199433 Year: 2020 Publisher: Piscataway, NJ : IEEE,

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Periodical
Proceedings of technical papers
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ISSN: 19308868 Year: 1983 Publisher: Hsinchu, Taiwan, R.O.C. : Piscataway, NJ, U.S.A. : ERSO, ITRI ; IEEE Service Center [distributor]

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2008 International Symposium on VLSI Technology, Systems and Applications
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ISBN: 1424416140 1424416159 1509077456 Year: 2008 Publisher: [Place of publication not identified] I E E E

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2007 International Symposium on VLSI Technology
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ISBN: 142440584X 1509085297 Year: 2006 Publisher: [Place of publication not identified] IEEE

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2013 Symposium on VLSI Technology
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ISBN: 1467352284 1467352268 Year: 2013 Publisher: [Place of publication not identified] IEEE

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2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
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ISBN: 1467394998 146739498X Year: 2016 Publisher: Piscataway, New Jersey : IEEE,

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Annotation RF, analog and mixed signal circuits Sensors and interface circuits Digital circuits and ASIC CPU, DSP and multicore architectures Memory circuits and systems Low power logic and architectures Multimedia processing circuits Communication circuits Embedded systems and software Designs using novel technologies System in package design Electronic System Level Design Modeling and simulation Hardware software co design Logic and architecture synthesis.


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2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
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ISBN: 1467394793 1467394785 Year: 2016 Publisher: Piscataway, NJ : IEEE,

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Annotation Low power CMOS and embedded memory Foundry technology RF process, device and integration technology Standalone memory DRAM, FLASH, emerging memory technology Advanced CMOS modules e g gate stack, contact, doping, strained channel, non Si integration, interconnect technology, etc Lithography directed self assembly, EUV, multiple patterning, etc Power and analog IC device and technology Advanced CMOS process and devices Ge, SiGe, III V, GAA, 2D 1D Process and device modeling TFT and organic electronics MEMS, imagers and sensors Advanced manufacturing technology, yield, reliability and test 3D ICs and advanced packaging Photonics Energy harvesting technology loT enabling technologies.


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Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) : 12-14 October 2015, University of Massachusetts Amherst, USA
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ISBN: 1479986313 1479986062 Year: 2015 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,

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GLSVLSI '15 : the 25th edition of the 2015 Great Lakes Symposium on VLSI : May 20-22, 2015, Pittsburgh, PA, USA
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ISBN: 1450334741 Year: 2015 Publisher: New York : ACM,

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