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EXAFS : basic principles and data analysis
Author: Teo, Boon K
ISBN: 0387158332 3540158332 3642500331 3642500315 9783540158332 Year: 1986 Volume: 9 Publisher: Berlin,New York : Springer-Verlag,

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Abstract

Keywords
Extended X-ray absorption fine structure --- Spectrométrie EXAFS --- Extended X-ray absorption fine structure. --- Spectrométrie EXAFS

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