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Book
Anomalous photoconductivity
Authors: ---
ISBN: 0470504285 9780470504284 Year: 1973 Publisher: New York Wiley

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Optical processes in semiconductors
Author:
ISBN: 0486602753 Year: 1971 Publisher: New York : Dover Publications,

Hardening semiconductor components against radiation and temperature
Authors: --- ---
ISBN: 0815512120 9780815512127 Year: 1989 Publisher: Park Ridge Noyes data corporation

Ionizing radiation effects in MOS devices and circuits
Authors: ---
ISBN: 047184893X 9780471848936 Year: 1989 Publisher: New York : Wiley,


Book
Robust SRAM designs and analysis
Authors: ---
ISBN: 1461408172 1461408180 Year: 2012 Publisher: New York : Springer,

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Abstract

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.

Radiation effects in advanced semiconductor materials and devices
Authors: ---
ISBN: 3540433937 3642077781 3662049740 Year: 2002 Publisher: Berlin ; New York, NY : Springer,

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In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.

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