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Inelastic deformation of composite materials: IUTAM Symposium, Troy, New York, May 29-June 1, 1990
Author:
ISBN: 354097458X 038797458X 1461391113 1461391091 9783540974581 9780387974583 Year: 1991 Publisher: Berlin Springer


Book
Proceedings of the European conference on spacecraft structures, materials & mechanical testing 2005.
Author:
ISSN: 1609042X ISBN: 9290928921 9789290928928 Year: 2005 Volume: 581 Publisher: Noordwijk ESA

Dynamic elastic modulus measurements in materials
Author:
ISBN: 0803112912 9780803112919 Year: 1990 Volume: 1045 Publisher: Philadelphia (Pa.): ASTM


Book
Experimental and Applied Mechanics, Volume 6 : Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Authors: --- ---
ISBN: 9783319069890 3319069888 9783319069883 1322136076 3319069896 Year: 2015 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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Abstract

Experimental and Applied Mechanics, Volume 6: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the sixth volume of eight from the Conference, brings together contributions to important areas of research and engineering.  The collection presents early findings and case studies on a wide range of topics, including: Advances in Residual Stress Measurement Methods Residual Stress Effects on Material Performance Inverse Problems and Hybrid Techniques Thermoelastic Stress Analysis Infrared Techniques Research in Progress Applications in Experimental Mechanics.


Book
Analog IC reliability in nanometer CMOS
Authors: ---
ISBN: 1489986308 1461461626 1461461634 1299197396 Year: 2013 Publisher: New York, NY : Springer Science,

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.   The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.   ·         Enables readers to understand long-term reliability of an integrated circuit; ·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; ·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; ·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.


Book
Nondestructive testing of materials and structures : proceedings of NDTMS-2011, Istanbul, Turkey, May 15-18, 2011
Authors: ---
ISSN: 22110844 ISBN: 9789400707238 9789400707221 9400707223 9400707231 1283612135 Year: 2013 Volume: v. 6 Publisher: New York : Springer,

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Abstract

Condition assessment and characterization of materials and structures by means of nondestructive testing (NDT) methods is a priority need around the world to meet the challenges associated with the durability, maintenance, rehabilitation, retrofitting, renewal and health monitoring of new and existing infrastructures including historic monuments. Numerous NDT methods that make use of certain components of the electromagnetic and acoustic spectra are currently in use to this effect with various levels of success and there is an intensive worldwide research effort aimed at improving the existing methods and developing new ones. The knowledge and information compiled in this book captures the current state-of-the-art in NDT methods and their application to civil and other engineering materials and structures. Critical reviews and advanced interdisciplinary discussions by world-renowned researchers point to the capabilities and limitations of the currently used NDT methods and shed light on current and future research directions to overcome the challenges in their development and practical use. In this respect, the contents of this book will equally benefit practicing engineers and researchers who take part in characterization, assessment, evaluation and health monitoring of materials and structures.

Keywords

materiaalkennis --- laboratoriuminstrumenten --- Building materials. Building technology --- mijnbouw --- meetkundige instrumenten --- procescontrole --- Artificial intelligence. Robotics. Simulation. Graphics --- ingenieurswetenschappen --- bouwmaterialen --- elektrische meettechniek --- vormgeving --- bouwconstructies --- Materials sciences --- mineralen (chemie) --- Physics --- Civil engineering. Building industry --- Applied physical engineering --- Surface chemistry --- micro-elektronica --- oppervlakte-onderzoek --- simulaties --- Chemical laboratory practice --- Measuring methods in physics --- materialen (technologie) --- Computer simulation. --- Building construction. --- Materials. --- Surfaces (Physics) --- Engineering. --- Simulation par ordinateur --- Matériaux --- Surfaces (Physique) --- Ingénierie --- Nondestructive testing. --- Buildings --- Testing. --- Composite materials -- Fatigue -- Congresses. --- Materials -- Testing -- Congresses. --- Nondestructive testing -- Congresses. --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Materials Science --- Nondestructive testing --- Testing --- Physical measurements. --- Measurement. --- Building materials. --- Structural materials. --- Materials science. --- Building Materials. --- Structural Materials. --- Measurement Science and Instrumentation. --- Simulation and Modeling. --- Characterization and Evaluation of Materials. --- Edifices --- Halls --- Structures --- Architecture --- Surfaces (Physics). --- Surfaces (Technology) --- Computer modeling --- Computer models --- Modeling, Computer --- Models, Computer --- Simulation, Computer --- Electromechanical analogies --- Mathematical models --- Simulation methods --- Model-integrated computing --- Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Materials --- Measurement   . --- Material science --- Physical sciences --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Architectural materials --- Building --- Building supplies --- Construction materials --- Structural materials

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