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SOLID --- LOW ENERGY ELECTRON DIFFRACTION --- SURFACES (TECHNOLOGY) --- SOLID --- LOW ENERGY ELECTRON DIFFRACTION --- SURFACES (TECHNOLOGY)
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Low energy electron diffraction. --- Surface chemistry. --- Surfaces (Physics) --- Surfaces (Physics).
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Solids --- Surfaces (Technology) --- Low energy electron diffraction --- Congresses.
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This timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters.
Surface chemistry. --- Surfaces (Technology) --- Low energy electron diffraction. --- X-ray diffraction imaging. --- Chemical structure. --- Analysis.
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Experimental solid state physics --- 535.42 --- Diffraction --- Crystallography. --- Surface chemistry. --- Low energy electron diffraction. --- 535.42 Diffraction --- Electron diffraction --- Surface properties
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Low energy electron diffraction --- Crystallography --- Crystallography. --- Low energy electron diffraction. --- Surface chemistry. --- Surface chemistry --- Chemistry, Surface --- Interfaces, Chemistry of --- Surface phenomena --- Surfaces (Chemistry) --- Chemistry, Physical and theoretical --- Capillarity --- Surface energy --- Surface tension --- Surfaces (Physics) --- LEED (Solids) --- Electrons --- Leptology --- Physical sciences --- Mineralogy --- Diffraction --- Leed (diffractometry) --- Scattering
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This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes. Provides a unified description of full-field, low energy electron microscopies Presents the basic theory and experiment of low energy emission and reflection Compares the possibilities and limitations of the various imaging methods Describes multi-method studies Contains an extensive list of references for easy access to the original literature /ul>.
Materials --- Electron microscopy. --- Low energy electron diffraction. --- Microscopy. --- Microscopy --- LEED (Solids) --- Electrons --- Diffraction --- Surfaces (Physics). --- Spectroscopy. --- Characterization and Evaluation of Materials. --- Spectroscopy/Spectrometry. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Biological Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Surface chemistry --- Surfaces (Technology) --- Qualitative --- Spectrometry --- Materials science. --- Solid state physics. --- Materials—Surfaces. --- Thin films. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Material science --- Physical sciences --- Analytical chemistry
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This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. The achievable temporal resolution in the low-energy regime is improved by several orders of magnitude and has enabled the the melting of a highly-sensitive, molecularly thin layer of a polymer crystal to be resolved for the first time.This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films. It will be of fundamental importance for understanding the properties of nanomaterials so as to tailor their properties.
Physics. --- Surface and Interface Science, Thin Films. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surfaces (Physics). --- Physique --- Surfaces (Physique) --- Physics --- Physical Sciences & Mathematics --- Atomic Physics --- Electricity & Magnetism --- Interfaces (Physical sciences). --- Thin films. --- Spectroscopy. --- Microscopy. --- Materials --- Surfaces. --- Surface chemistry --- Surfaces (Technology) --- Materials—Surfaces. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Surfaces (Physics) --- Qualitative --- Low energy electron diffraction. --- LEED (Solids) --- Electrons --- Diffraction --- Spectrometry --- Analytical chemistry
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532.535 --- 532.535 Hydraulic jumps --- Hydraulic jumps --- Experimental nuclear and elementary particle physics --- Superconductors, Type II --- Irreversible processes --- Processus irréversibles --- Electroweak interactions --- Interactions électrofaibles --- Lattice dynamics. --- Point defects. --- Metals --- Continuum mechanics. --- Defects. --- Elementary particles --- Nuclear physics --- Mechanical properties of solids --- Physics --- Statistical physics --- Plasma physics --- Electronics and optics of solids --- Plasma frequencies. --- Surfaces --- Optical properties. --- Diffraction gratings. --- Light --- Plasmons (Physics). --- Surfaces (Physics). --- Scattering. --- Electronic excitation. --- 548.24 --- 548.24 Twins. Multiples. Crystal complexes --- Twins. Multiples. Crystal complexes --- 621.3.038.62 --- 621.3.038.62 Accelerators according to particles accelerated --- Accelerators according to particles accelerated --- 538.9 --- Physics of condensed matter (in liquid state and solid state) --- 539.17 --- 539.17 Nuclear reactions. Fission. Fusion. Chain reactions etc. --- Nuclear reactions. Fission. Fusion. Chain reactions etc. --- 531.19 --- 536.75 --- 536.75 Entropy. Statistical thermodynamics. Irreversible processes --- Entropy. Statistical thermodynamics. Irreversible processes --- 531.19 Statistical mechanics --- Statistical mechanics --- 539.12 --- 539.12 Elementary and simple particles (charge less than 3 including alpha-rays, beta-rays, gamma-rays as individual particles or as radiation) --- Elementary and simple particles (charge less than 3 including alpha-rays, beta-rays, gamma-rays as individual particles or as radiation) --- 538.91 --- 539.171 --- 539.171 Scattering: elastic, inelastic. Polarization --- Scattering: elastic, inelastic. Polarization --- 538.91 Structures, including transitions --- Structures, including transitions --- 53 --- 548.121 --- 548.121 Rotation. Axes of symmetry. Rotation axes --- Rotation. Axes of symmetry. Rotation axes --- 539.125.5 --- 539.125.5 Neutrons --- Neutrons --- 539.14 --- 539.14 Nuclei --- Nuclei --- 546.29 --- 546.29 Zerovalent elements --- Zerovalent elements --- 539.18 --- 539.18 Physics of single atoms --- Physics of single atoms --- Materials - Hydrogen content - Measurement --- Nuclear physics - Technique --- Helium - Thermal properties --- Scattering (Physics) --- Surfaces (Physics) --- Optical fibers --- Solitons --- Semiconductors --- Radiative transfer --- Transfert radiatif --- Superconductors --- Helium --- Materials --- Low energy electron diffraction. --- Exciton theory. --- Molecular crystals.
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