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Optical pattern recognition --- Image processing --- Physics --- Congresses. --- Image processing. --- Optical pattern recognition - Congresses. --- Image processing - Congresses. --- Physics - Congresses.

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Image processing --- Pattern recognition systems --- Congresses --- -Pattern recognition systems --- -Pattern classification systems --- Pattern recognition computers --- Pattern perception --- Computer vision --- Pictorial data processing --- Picture processing --- Processing, Image --- Imaging systems --- Optical data processing --- Congresses. --- -Congresses --- Image processing - Congresses --- Pattern recognition systems - Congresses

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Remote sensing --- Synthetic aperture radar --- Image processing --- 629.78 <063> --- Synthetic aperture radar. --- SAR (Synthetic aperture radar) --- Coherent radar --- Remote-sensing imagery --- Remote sensing systems --- Remote terrain sensing --- Sensing, Remote --- Terrain sensing, Remote --- Aerial photogrammetry --- Aerospace telemetry --- Detectors --- Space optics --- Pictorial data processing --- Picture processing --- Processing, Image --- Imaging systems --- Optical data processing --- Ruimteschip--Congressen --- Remote sensing - Congresses --- Synthetic aperture radar - Congresses --- Image processing - Congresses

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The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields. Topics of particular interest are: New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering) Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility) 4D Optical Metrology over a Large Scale Range (from Macro to Nano) Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment) New Optical Sensors and Measurement Systems for Industrial Inspection. Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

Image processing --Congresses. --- Metrology --Congresses. --- Optical measurements --Congresses. --- Optical measurements --- Metrology --- Image processing --- Light & Optics --- Industrial & Management Engineering --- Materials Science --- Technology - General --- Physics --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Mechanical Engineering --- Physical Sciences & Mathematics --- Engineering. --- Image processing. --- Quality control. --- Reliability. --- Industrial safety. --- Quality Control, Reliability, Safety and Risk. --- Optics, Lasers, Photonics, Optical Devices. --- Signal, Image and Speech Processing. --- Image Processing and Computer Vision.

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Remote sensing --- Synthetic aperture radar --- Image processing --- Signal processing --- Interferometry --- Congresses. --- -Interferometry --- -Remote sensing --- -Signal processing --- -Synthetic aperture radar --- #TWER:WTCM --- Processing, Signal --- Information measurement --- Signal theory (Telecommunication) --- Remote-sensing imagery --- Remote sensing systems --- Remote terrain sensing --- Sensing, Remote --- Terrain sensing, Remote --- Aerial photogrammetry --- Aerospace telemetry --- Detectors --- Space optics --- Optical measurements --- Pictorial data processing --- Picture processing --- Processing, Image --- Imaging systems --- Optical data processing --- Congresses --- ERS-1 (Artificial satellite) --- -European Remote Sensing Satellite --- -Congresses --- European Remote Sensing Satellite --- Remote sensing - Congresses. --- Synthetic aperture radar - Congresses. --- Image processing - Congresses. --- Signal processing - Congresses. --- Interferometry - Congresses.