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The data format that shall be used for both required and optional data to be made available by radiation measurement instruments for homeland security applications is specified. The performance for these types of instruments is described in other standards; such as ANSI N42.32, ANSI N42.33, ANSI N42.34, ANSI N42.35, ANSI N42.38, ANSI N42.43, ANSI N42.48, ANSI N42.49A, and ANSI N42.53.
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The data format that shall be used for both required and optional data to be made available by radiation measurement instruments for homeland security applications is specified. The performance for these types of instruments is described in other standards; such as ANSI N42.32, ANSI N42.33, ANSI N42.34, ANSI N42.35, ANSI N42.38, ANSI N42.43, ANSI N42.48, ANSI N42.49A, and ANSI N42.53. The PDF of this standard is available at no cost compliments of Department of Homeland Security Domestic Nuclear Detection Office.
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CMI 2016 will be the first biennial flagship event of IEEE Joint CSS IMS Chapter, Kolkata Section, India This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications CMI 2016 will comprise keynote and plenary sessions by eminent academicians, regular and poster sessions of contributed papers, special sessions and tutorial sessions All papers will undergo blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance.
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Collection of selected, peer reviewed papers from the 11 th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany. The 60 papers are grouped as follows: Chapter 1: Metrology for SI, Chapter 2: Position & Displacement Metrology, Chapter 3: Micro- and Nanometrology, Chapter 4: Macrometrology, Chapter 5: Optical Metrology, Chapter 6: Sensors and Actuators, Chapter 7: Material Properties' Characterization, Chapter 8: Intelligent Instruments for Automation, Chapter 9: Management of Measurement Processes, Chapter 10: Calibration
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