Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

FIELD EMISSION --- FIELD ION MICROSCOPY --- FIELD EMISSION --- FIELD ION MICROSCOPY

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Field emission. --- Field ion microscopy.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.

Atom-probe field ion microscopy.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

This dissertation examines the use of atom probe tomography to study hard ceramic thin films, such as TiSiN, ZrAlN, ZrB2, and ZrTaB2, which are used in wear-resistant coatings. The research addresses challenges in quantitative atom probe tomography, including mass spectral overlaps and compositional errors due to correlated evaporation. By employing isotopic substitution and advanced analytical techniques, the study reveals structural and compositional details at the nanoscale, including self-organized structures and metal-rich boundaries that enhance material properties like hardness and toughness. The work also identifies an instrumental artifact in the detection system that affects data accuracy. The findings provide insights into optimizing thin film deposition processes and improving analytical methodologies, aimed at researchers and professionals in materials science and engineering.

Atom-probe field ion microscopy. --- Ceramic materials.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

Tomography. --- Transmission electron microscopy. --- Atom-probe field ion microscopy.