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Field ionization mass spectrometry
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Author: Beckey, Hans Dieter
ISBN: 0080175570 Year: 1971 Publisher: Oxford : Pergamon press,
ISBN: 0080175570 Year: 1971 Publisher: Oxford : Pergamon press,
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Abstract
Keywords
Charge distribution. --- FI probability. --- FI sources. --- Field electron emission. --- Field ionization mass spectrometry. --- Minimum distance. --- Particle supply. --- Sharp metal edge.
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