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2013 22nd Asian Test Symposium : (ATS 2013) : Yilan, Taiwan, 18-21 November 2013
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ISBN: 0769550800 1479908711 Year: 2013 Publisher: Piscataway, NJ, : IEEE,

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Algorithms for synthesis and testing of asynchronous circuits
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ISBN: 0792393643 1461364108 1461532124 9780792393641 Year: 1993 Volume: SECS 232 Publisher: Boston : Kluwer Academic Publishers,

Logic design : a review of theory and practice
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ISBN: 0124365507 032316045X 9780124365506 Year: 1974 Publisher: New York, N.Y. Academic Press

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Computer logic design
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ISBN: 0131654721 9780131654723 Year: 1972 Publisher: Englewood Cliffs (N.J.) : Prentice Hall,

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Arithmetic operations in digital computers
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Year: 1955 Publisher: New York : Van Nostrand,

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Logical design of switching circuits.
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ISBN: 0171760034 9780171760033 Year: 1968 Publisher: London : Nelson,

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Symbolic model checking
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ISBN: 0792393805 1461363993 146153190X 9780792393801 Year: 1993 Publisher: Boston (Mass.): Kluwer,


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Robust computing with nano-scale devices : progresses and challenges
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ISBN: 9048185416 9048185394 1282926926 9786612926921 9048185408 Year: 2010 Publisher: Dordrecht : Springer,

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Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

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