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The effects of radiation on electronic systems.
Authors: ---
ISBN: 0442254172 9780442254179 Year: 1986 Publisher: New York (N.Y.) Van Nostrand

Radiation effects on and dose enhancement of electronic materials
Authors: --- ---
ISBN: 0815510071 9780815510079 Year: 1984 Publisher: Park Ridge Noyes Publications


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2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
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ISBN: 1538641356 1538641364 Year: 2018 Publisher: Piscataway, NJ : IEEE,


Book
Soft errors in modern electronic systems
Author:
ISBN: 1441969926 9786612972645 1441969934 1282972642 Year: 2011 Publisher: New York : Springer,

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Abstract

Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.

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