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Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Electron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Emission

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fysicochemie --- Chemical and physical cristallography --- Crystals --- -Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Crystallography --- Powders --- Solids --- Spectra --- Emission --- Electron spectroscopy. --- Spectra. --- Electron spectroscopy --- Chemical and physical crystallography

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Portable X-ray fluorescence (PXRF) instrumentation has some unique analytical capabilities for the in situ analysis of samples in the field. These capabilities have been extended in recent years by the continuing development of solid state detectors, surface mounted electronics, digital signal processing technology, Li-ion batteries combined with a choice of rugged sealed radioisotope sources or miniature X-ray tubes that provide lightweight hand-held devices. As well as opening up new applications, in situ measurements by PXRF, where the instrument is placed in direct contact with the object to be analysed, involve the complete integration of sampling and analysis. Careful interpretation of results is therefore required, particularly when the analysis is used to estimate the bulk composition of a sample. In this monograph, an overview is given of instrumentation, analytical capabilities, and limitations in the interpretation of results, sampling considerations and applications where PXRF offers substantial advantages over conventional analytical techniques. The aim is to give the reader an insight into the capabilities of the technique and to demonstrate the contribution it can make to a range of areas of contemporary scientific interest. Chapters are written by internationally recognised scientists with practical experience of in situ analysis using portable X-ray fluorescence and demonstrates the wide range of applications for the technique. The topics covered are illustrated with diagrams and photographs where appropriate and each chapter includes supporting references to enable the reader to gain a greater understanding of a particular application. Topics include: -analytical capabilities -instrumentation -quantification -correction procedures -sampling considerations -future developments Applications include: -the assessment of contaminated land -surfaces -coatings and paints -workplace monitoring -metal & alloy sorting -geochemical prospecting -archaeological investigations -museum samples & works of art -extraterrestrial analysis The work is aimed at scientists who have some knowledge of analytical techniques and/or the applications covered, but are not fully familiar with the capabilities of PXRF. It offers a general introduction to the technique and its applications rather than a research monograph. As such, it is aimed at analytical scientists, environmental and geological scientists, industrial hygienists, industrial and plant scientists, archaeometrists and museum researchers, research scientists and research students with projects in the applications covered. Undergraduate students studying associated degree courses will also benefit from the work.

X-ray spectroscopy. --- Spectroscopie des rayons X. --- X-ray spectroscopy --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- Spectrum analysis --- XES (X-ray emission spectroscopy) --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy

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Spectrometric and optical chemical analysis --- fysicochemie --- 543.422.27 --- Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Emission --- 543.422.27 Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Electron spectroscopy.

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Electron spectroscopy --- Spectroscopie électronique --- 543.422.27 --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Emission --- Electron spectroscopy. --- Inner shells --- Valence bond spectra --- Inner shells. --- Valence bond spectra. --- 543.422.27 Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Spectroscopie électronique