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Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Electron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Emission

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X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and

X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy

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fysicochemie --- Chemical and physical cristallography --- Crystals --- -Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Crystallography --- Powders --- Solids --- Spectra --- Emission --- Electron spectroscopy. --- Spectra. --- Electron spectroscopy --- Chemical and physical crystallography

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fysicochemie --- Inorganic chemistry --- Chemistry, Physical and theoretical --- Chemistry, Inorganic --- Chimie physique et théorique --- Chimie inorganique --- 541.1 --- 546 --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Inorganic compounds --- Chemistry, Inorganic. --- Chemistry, Physical and theoretical. --- Circular dichroism --- Diffraction methods --- EPR --- Electronic absorption --- Esca --- Molecular pes --- Mossbauer --- NMR --- NQR --- Optical rotatory dispersion --- Raman --- Thermochemistry --- Vibration --- Circular dichroism. --- Diffraction methods. --- EPR. --- Electronic absorption. --- Esca. --- Molecular pes. --- Mossbauer. --- NMR. --- NQR. --- Optical rotatory dispersion. --- Raman. --- Thermochemistry. --- Vibration. --- 546 Inorganic chemistry --- 541.1 Physical chemistry

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Theoretical spectroscopy. Spectroscopic techniques --- Chemical structure --- fysicochemie --- Chemical bonds. Valence --- Electron spectroscopy --- Elektronische spectroscopie --- Moleculaire spectroscopie --- Molecular spectroscopy --- Spectroscopie [Moleculaire ] --- Spectroscopie electronique --- Spectroscopie moléculaire --- Spectroscopy [Molecular ] --- 541.57 --- Molecular spectroscpy --- #WSCH:AAS2 --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Bonds --- Emission --- 541.57 Bonds --- Spectroscopy, Molecular --- Spectrum analysis --- Molecular spectra