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Book
Digital System Test and Testable Design : Using HDL Models and Architectures
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ISBN: 1441975470 1441975489 Year: 2011 Publisher: New York, NY : Springer US : Imprint: Springer,

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Digital System Test and Testable Design: Using HDL Models and Architectures by: Zainalabedin Navabi This book is about digital system test and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware / software environment facilitates description of complex test programs and test strategies. •Combines design and test •Describes test methods in Verilog and PLI, which makes the methods more understandable and the gates possible to simulate •Simulation of gate models allows fault simulation and test generation, while Verilog testbenches inject faults, evaluate fault coverage and apply new test patterns •Describes DFT, compression, decompression, and BIST techniques in Verilog, which makes the hardware of the architectures easier to understand and allows simulation and evaluation of the testability methods •Virtual testers (Verilog testbenches) play the role of ATEs for driving scan tests and examining the circuit under test •Verilog descriptions of scan designs and BIST architectures are available that can be used in actual designs •PLI test utilities developed in-text are available for download •Introductory Video for Verilog basics, software developed in-text, and PLI basics available for download •Powerpoint slides available for each chapter.


Book
Digital systems testing and testable design
Authors: --- ---
ISBN: 0716781794 9780716781790 Year: 1990 Publisher: New York, N.Y. Computer Science Press

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This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Authors: ---
ISBN: 0792379918 9780792379911 9780306470400 0306470403 1601190174 1280206098 9786610206094 1475781423 Year: 2002 Volume: 17 Publisher: New York, NY : Springer US : Imprint: Springer,

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device technology, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signal subsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Keywords

Integrated circuits --- Digital integrated circuits --- Mixed signal circuits --- Semiconductor storage devices --- Very large scale integration --- Testing --- -Integrated circuits --- -Semiconductor storage devices --- -Semiconductor memories --- Computer storage devices --- Semiconductors --- Circuits, Mixed signal --- Mixed analog-digital integrated circuits --- Mixed mode integrated circuits --- Very large scale integration of circuits --- VLSI circuits --- Digital electronics --- Very large scale integration. --- Circuits intégrés numériques --- Digital integrated circuits -- Testing. --- Integrated circuits -- Very large scale integration -- Testing. --- Mixed signal circuits -- Testing. --- Semiconductor storage devices -- Testing. --- Engineering. --- Computers. --- Computer-aided engineering. --- Electrical engineering. --- Electronics. --- Microelectronics. --- Electronic circuits. --- Electronics and Microelectronics, Instrumentation. --- Theory of Computation. --- Circuits and Systems. --- Electrical Engineering. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Testing. --- Semiconductor memories --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Very large scale integration&delete& --- Information theory. --- Systems engineering. --- Computer engineering. --- Computer aided design. --- Electronic circuits --- Microelectronics --- CAE --- Engineering --- Electric engineering --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Automatic computers --- Automatic data processors --- Computer hardware --- Computing machines (Computers) --- Electronic brains --- Electronic calculating-machines --- Electronic computers --- Hardware, Computer --- Computer systems --- Cybernetics --- Machine theory --- Calculators --- Cyberspace --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Microtechnology --- Miniature electronic equipment --- Electrical engineering --- Physical sciences --- Data processing --- Integrated circuits - Very large scale integration - Testing --- Digital integrated circuits - Testing --- Mixed signal circuits - Testing --- Semiconductor storage devices - Testing

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