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This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.

Integrated circuits --- Automatic test equipment. --- Very high speed integrated circuits. --- VHSIC --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Automatic checkout equipment --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Testing. --- Very large scale integration --- Equipment and supplies

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621.3.049.77 --- Automatic checkout equipment --- -Integrated circuits --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Microelectronics. Integrated circuits --- Congresses --- Testing --- -Congresses. --- Equipment and supplies --- 621.3.049.77 Microelectronics. Integrated circuits --- Automatic test equipment --- Integrated circuits

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621.3.049.77 --- Integrated circuits --- Automatic checkout equipment --- -ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Microelectronics. Integrated circuits --- Testing --- -Congresses. --- Congresses --- Equipment and supplies --- Automatic test equipment --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- -Microelectronics. Integrated circuits --- 621.3.049.77 Microelectronics. Integrated circuits --- -621.3.049.77 Microelectronics. Integrated circuits --- ACE (Automatic checkout equipment)

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Automatic checkout equipment --- Electronic digital computers --- -Error-correcting codes (Information theory) --- 681.3*B13 --- 681.3*B45 --- 681.3*B53 --- 681.3*E4 --- Codes, Error-correcting (Information theory) --- Error-detecting codes (Information theory) --- Forbidden-combination check (Information theory) --- Self-checking codes (Information theory) --- Artificial intelligence --- Automatic control --- Coding theory --- Information theory --- Automatic digital computers --- Computers, Electronic digital --- Digital computers, Electronic --- Computers --- Hybrid computers --- Sequential machine theory --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Design and construction --- Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation --- Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- Reliability and testing: built-in tests; error-checking; redundant design; test generation; testability (Register-transfer-level implementation) --- Coding and information theory: data compaction and compression; formal modelsof communication; nonsecret encoding schemes--See also {681.3*H11} --- Equipment and supplies --- Automatic test equipment. --- Error-correcting codes (Information theory) --- Design and construction. --- Error-correcting codes (Information theory). --- 681.3*E4 Coding and information theory: data compaction and compression; formal modelsof communication; nonsecret encoding schemes--See also {681.3*H11} --- 681.3*B53 Reliability and testing: built-in tests; error-checking; redundant design; test generation; testability (Register-transfer-level implementation) --- 681.3*B45 Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- 681.3*B13 Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation