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Book
ISBN: 1424419352 1424419360 1509074104 9781509074105 9781424419364 Year: 2008 Publisher: [Place of publication not identified] I E E E
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Book
ISBN: 0738157031 Year: 2008 Publisher: New York : IEEE,
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This standard is intended to promote and facilitate interoperability between components of an automatic test system (e.g., between test executive and diagnostic reasoner)where test results need to be shared. The standard thus facilitates the capture of test results data in storage devices and databases, facilitating online and offline analysis. The test results schema becomes a class of information that can be used within the SIMICA family of standards.
Book
ISBN: 0738162663 Year: 2007 Publisher: New York : IEEE,
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Guidance in the use of the signal and test definition (STD) standard is provided. STD provides the means to define and describe signals used in testing. This guide describes how to implement, apply, and use a set of common basic signals to form complex signals usable across all test platforms.
Book
ISBN: 0738152463 Year: 2006 Publisher: New York : IEEE,
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This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
Book
ISBN: 0738164569 Year: 2011 Publisher: New York : IEEE,
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This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard. Keywords: ATE description, ATE test results, ATML, ATS, automatic test equipment, automatic test markup language, automatic test system, interface test adapter, ITA, SI, synthetic instrumentation, test configuration, unit under test, UUT description, UUT maintenance, XML instance document, XML schema.
Book
ISBN: 0738160660 Year: 2009 Publisher: New York : IEEE,
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This document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the development of test program sets (TPSs) that will be used in an automatic test environment. Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), Automatic Test Markup Language (ATML) instance document, automatic test system (ATS), diagnostic requirements, test description, Test Program Set (TPS), test requirements, Test Requirements Document (TRD), XML schema.
Book
ISBN: 0738181528 Year: 2009 Publisher: New York : IEEE,
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This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.
Book
ISBN: 0738183768 Year: 2013 Publisher: New York : IEEE,
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An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS)that is to be used to test and diagnose a unit under test (UUT).
Book
ISBN: 0738181668 Year: 2012 Publisher: New York, N.Y. : IEEE,
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An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.
Book
ISBN: 0738196223 Year: 2015 Publisher: New York, N.Y. : IEEE,
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An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
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