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Atom-probe field ion microscopy.

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Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.

Atom-probe field ion microscopy.

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Atom-probe field ion microscopy. --- Microscopie ionique à champ et sonde atomique --- Microscopie ionique à champ et sonde atomique --- Atom-probe field ion microscopy --- Field ion microscopy

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The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three­ dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three­ dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Atom-probe field ion microscopy. --- Tomography. --- Microscopie ionique à champ et sonde atomique --- Scanographie --- Microscopie ionique à champ et sonde atomique --- Atom-probe field ion microscopy --- Tomography --- Body section radiography --- Computed tomography --- Computerized tomography --- CT (Computer tomography) --- Laminagraphy --- Laminography --- Radiological stratigraphy --- Stratigraphy, Radiological --- Tomographic imaging --- Zonography --- Computer tomography --- CT (Computed tomography) --- Cross-sectional imaging --- Radiography, Medical --- Geometric tomography --- Field ion microscopy --- Materials science. --- Metals. --- Characterization and Evaluation of Materials. --- Metallic Materials. --- Metallic elements --- Chemical elements --- Ores --- Metallurgy --- Material science --- Physical sciences

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy.

Atomic force microscopy. --- Atom-probe field ion microscopy. --- Scanning probe microscopy. --- Atomic force microscopy --- Scanning probe microscopy --- Atom-probe field ion microscopy --- Biology --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Health & Biological Sciences --- Microscopy --- Materials Science --- Surfaces (Physics). --- Nanochemistry. --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Nanoscale Science and Technology. --- Spectroscopy and Microscopy. --- Field ion microscopy --- Molecular technology --- Nanoscale technology --- High technology --- Nanoscale chemistry --- Chemistry, Analytic --- Nanoscience --- Physics --- Surface chemistry --- Surfaces (Technology) --- Analytical chemistry --- Materials science. --- Nanoscale science. --- Nanoscience. --- Nanostructures. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Nano science --- Nanoscale science --- Nanosciences --- Science --- Material science --- Physical sciences --- Qualitative