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Time-to-Digital Converters (NoMe TDC), 2013 IEEE Nordic-Mediterranean Workshop on
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ISBN: 1479911844 1479911852 1479911860 9781479911868 Year: 2013 Publisher: Piscataway, NJ : IEEE,

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ANSI/IEEE Std 166-1977
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ISBN: 0738141739 Year: 1977 Publisher: [Place of publication not identified] : IEEE,

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Elektronische Analog-Digital-Umsetzer : Verfahren, Bauelemente, Beispiele
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ISBN: 0387079548 Year: 1977 Publisher: Berlin ; New York : Springer-Verlag,

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Static and dynamic performance limitations for high speed D/A converters
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ISBN: 1402077610 Year: 2004 Publisher: Boston Kluwer Academic Publishers

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Analog-to-digital conversion : a practical approach.
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ISBN: 0070156751 Year: 1995 Publisher: New York McGraw-Hill

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High-speed analog-to-digital conversion /Michael J. Demler
Year: 1991 Publisher: San Diego ; New York ; London Academic Press

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Low-voltage analog-to-digital converters and mixed-signal interfaces
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ISBN: 9789176858905 Year: 2015 Publisher: Linkoping, Sweden : Linkoping University,

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1241-2023 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
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ISBN: 1504496906 Year: 2023 Publisher: New York, USA : IEEE,

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The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.


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IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000) : IEEE standard for terminology and test methods for analog-to-digital converters
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ISBN: 0738162396 Year: 2011 Publisher: [Place of publication not identified] : IEEE,

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The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization. Keywords: ADC, analog-to-digital converter, code transition level, coherent sampling, DNL, ENOB, histogram, INL, LSB, missing codes, noise power ratio, noncoherent sampling, quantization error, quantization noise, SAR, SFDR, sine fitting.

Sigma Delta modulators : nonlinear decoding algorithms and stability analysis
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ISBN: 0792393090 9780792393092 Year: 1993 Publisher: Boston: Kluwer,

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