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681.3*B13 --- 681.3*B23 --- 681.3*B34 --- 681.3*B45 --- Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation --- Reliability, testing and fault-tolerance: diagnostics; error-ckecking; redundant design; test generation (Arithmetic and logic structures) --- Reliability, testing and fault-tolerance: diagnostics; error-checking; redundant design; test generation (Memory structures) --- Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- 681.3*B45 Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- 681.3*B34 Reliability, testing and fault-tolerance: diagnostics; error-checking; redundant design; test generation (Memory structures) --- 681.3*B23 Reliability, testing and fault-tolerance: diagnostics; error-ckecking; redundant design; test generation (Arithmetic and logic structures) --- 681.3*B13 Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation --- Vlsi --- Architecture --- Proceedings --- Ieee --- Hardware