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The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science. The audience is thus comprised of all scientists using the method: graduate students who may be starting research in this area, powder diffraction specialists, crystallographers, physicists, chemists, and materials scientists.
Rietveld method --- X-rays --- -PFSR (X-ray crystallography) --- Profile refinement (X-ray crystallography) --- Rietveld analysis --- Rietveld refinement --- Whole-pattern-fitting structure refinement (X-ray crystallography) --- Rays, Roentgen --- Roentgen rays --- Roentgenograms --- Diffraction --- -Data processing --- Rietveld method. --- X-ray crystallography --- Electromagnetic waves --- Ionizing radiation --- Radiation --- Cathode rays --- Radiography --- Vacuum-tubes --- Technique --- PFSR (X-ray crystallography) --- Diffraction&delete& --- Data processing --- fysicochemie --- Chemical and physical cristallography --- Data processing. --- Monograph --- -Rays, Roentgen --- Chemical and physical crystallography --- X-rays - Diffraction - Data processing. --- -Diffraction --- Crystal structure --- X-ray diffraction
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Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Rietveld method. --- X-rays --- Diffraction. --- Diffraction --- PFSR (X-ray crystallography) --- Profile refinement (X-ray crystallography) --- Rietveld analysis --- Rietveld refinement --- Whole-pattern-fitting structure refinement (X-ray crystallography) --- X-ray crystallography --- Technique --- Mineralogy. --- Crystallography. --- Chemistry, inorganic. --- Chemistry, Physical organic. --- Crystallography and Scattering Methods. --- Inorganic Chemistry. --- Physical Chemistry. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Inorganic chemistry --- Chemistry --- Inorganic compounds --- Leptology --- Physical sciences --- Mineralogy --- Physical geology --- Crystallography --- Minerals --- Inorganic chemistry. --- Physical chemistry. --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry
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