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ISBN: 1617282405 9781617282409 9781616689155 1616689153 Year: 2011 Publisher: New York
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X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and
Book
ISBN: 160650682X 9781606506820 9781606506813 1606506811 Year: 2015 Publisher: New York [New York] (222 East 46th Street, New York, NY 10017)
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Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.
Electron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Emission
ISBN: 0306357321 1468428195 1468428179 Year: 1978 Volume: vol 32 Publisher: New York (N.Y.): Plenum
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Experimental solid state physics --- Theoretical spectroscopy. Spectroscopic techniques --- fysicochemie --- Electron spectroscopy --- Ions --- Solids --- Spectra --- 531.72 --- -Solids --- -Solid state physics --- Transparent solids --- Intermediates (Chemistry) --- Matter --- Physics --- Solution (Chemistry) --- Electrolysis --- Electrons --- Electron spectroscopy for chemical analysis --- ESCA --- X-rays --- Measurement of surfaces, sections --- Properties --- Emission --- Electron spectroscopy. --- Spectra. --- -Measurement of surfaces, sections --- 531.72 Measurement of surfaces, sections --- -Electron spectroscopy for chemical analysis
ISBN: 0306401096 1461329035 1461329019 Year: 1979 Publisher: New York (N.Y.): Plenum
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fysicochemie --- Chemical and physical cristallography --- Crystals --- -Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Crystallography --- Powders --- Solids --- Spectra --- Emission --- Electron spectroscopy. --- Spectra. --- Electron spectroscopy --- Chemical and physical crystallography
Book
ISBN: 0471090514 Year: 1982 Publisher: New York (N.Y.): Wiley
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543.42 --- Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- Emission --- Electron spectroscopy. --- 543.42 Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis
Book
ISBN: 9780854045525 9781847558640 085404552X 184755864X Year: 2008 Publisher: Cambridge, UK : RSC Publishing
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"Portable X-ray Fluorescence Spectrometry: Capabilities for In Situ Analysis demonstrates the wide range of applications for the technique. Whilst many authors use commercially available instrumentation, applications such as the analysis of museum samples, works of art and extraterrestrial analysis demonstrate the ingenuity of the authors to develop and build equipment for specific studies, sampling, quantification and correction procedures are presented to give the reader a comprehensive introduction to the capabilities of PXRF for in situ analysis. Chapters are written by internationally recognised scientists with practical experience of in situ analysis using portable X-ray fluorescence. The book will be of interest to analytical scientists, environmental and geological scientists, industrial hygienists, industrial and plant scientists, archaeologists and museum researchers, research scientists and students."--Jacket.
X-ray spectroscopy. --- Spectroscopie des rayons X. --- X-ray spectroscopy --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- Spectrum analysis --- XES (X-ray emission spectroscopy) --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy
ISBN: 0471920827 0471920819 9780471920816 9780471920823 Year: 1990 Publisher: Chichester Wiley
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Experimental solid state physics --- Spectrometric and optical chemical analysis --- fysicochemie --- Surfaces (Technology) --- Electron spectroscopy. --- Analysis. --- 543.08 --- 543.42 --- Analytical measurement --- Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 543.42 Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 543.08 Analytical measurement --- -Electron spectroscopy for chemical analysis --- Applied chemical analysis --- Materials sciences --- Electron spectroscopy --- ESCA --- Electrons --- X-rays --- Characterization of surface --- Surface analysis --- Surface characterization --- Chemistry, Analytic --- Surface chemistry --- Analysis --- Emission --- Surfaces (technologie) --- Spectroscopie électronique. --- Analyse --- Analyse. --- SURFACES --- Auger photoelectron spectroscopy --- X-RAY PHOTOELECTRON SPECTROSCOPY --- Monograph --- Surfaces. --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy --- Curved surfaces --- Geometry --- Shapes --- Analytical chemistry --- -Characterization of surface --- Surfaces (Technology) - Analysis. --- -Analysis --- Spectroscopie électronique.
Book
ISBN: 0080169104 1322260109 1483152367 Year: 1972 Publisher: Oxford Pergamon
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Spectrometric and optical chemical analysis --- fysicochemie --- 543.422.27 --- Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Emission --- 543.422.27 Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Electron spectroscopy.
Book
ISBN: 3540522522 0387522522 3642634931 364258179X Year: 1991 Volume: 3 Publisher: Berlin Springer
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Theoretical spectroscopy. Spectroscopic techniques --- Chemical structure --- fysicochemie --- Chemical bonds. Valence --- Electron spectroscopy --- Elektronische spectroscopie --- Moleculaire spectroscopie --- Molecular spectroscopy --- Spectroscopie [Moleculaire ] --- Spectroscopie electronique --- Spectroscopie moléculaire --- Spectroscopy [Molecular ] --- 541.57 --- Molecular spectroscpy --- #WSCH:AAS2 --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Bonds --- Emission --- 541.57 Bonds --- Spectroscopy, Molecular --- Spectrum analysis --- Molecular spectra
ISBN: 0306339013 1475701209 1475701187 Year: 1975 Publisher: New York (N.Y.): Plenum
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Electron spectroscopy --- Spectroscopie électronique --- 543.422.27 --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Emission --- Electron spectroscopy. --- Inner shells --- Valence bond spectra --- Inner shells. --- Valence bond spectra. --- 543.422.27 Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Spectroscopie électronique
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