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Electron energy loss spectroscopy. --- Spectrometer. --- Electron optics. --- Electron energy-loss spectroscopy --- Electron optics --- Spectrometer

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This dissertation by Justinas Pališaitis investigates the optical responses of group III-nitrides (AlN, GaN, InN) and their alloys using Valence Electron Energy Loss Spectroscopy (VEELS). The research aims to evaluate VEELS's effectiveness for nanoscale material analysis, focusing on bulk plasmon energy's relation to material composition and strain. The study explores the compositional analysis of Al1-xInxN layers and investigates the effect of strain on valence EELS. It also examines the thermal stability and degradation mechanisms of Al1-xInxN films and phase separation through thermal annealing. The findings provide insights into the growth and properties of III-nitride structures, contributing to advancements in electronic device materials. The intended audience includes researchers and professionals in materials science and condensed matter physics.

Electron energy loss spectroscopy. --- Materials science. --- Electron energy loss spectroscopy --- Materials science

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Experimental solid state physics --- Spectrometric and optical chemical analysis --- fysicochemie --- Electron energy loss spectroscopy.

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Electronics and optics of solids --- Photoelectron spectroscopy --- Solids --- Photoemission --- Electronic structure --- X-ray absorption near edge structure --- Electron energy loss spectroscopy --- Spectra --- Solids - Spectra --- ELECTRON ENERGY-LOSS SPECTROSCOPY --- ELECTRONIC STRUCTURE --- ENERGY LEVELS (QUANTUM MECHANICS) --- PHOTOELECTRON SPECTROSCOPY --- PHOTOEMISSION --- SOLIDS --- X-RAY ABSORPTION NEAR EDGE STRUCTURE --- SPECTRA

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Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.

Transmission electron microscopy. --- Electron microscopy --- Analytical Electron Microscopy --- Ceramics --- Chemical Analysis --- Chemistry --- Composites --- Crystallography --- Electron Diffraction --- Electron Energy- Loss Spectroscopy (EELS) --- Forensic Science --- Geosciences --- Imaging --- Industry --- Life Sciences --- Materials Science and Engineering --- Metals and Alloys --- Microstructure --- Nanomaterials --- Nanoscience --- Nanotechnology --- Physics --- Scanning Transmission Electron Microscopy (STEM) --- Polymer --- Structure --- Transmission Electron Microscopy (TEM) --- X-ray Energy- Dispersive Spectroscopy (EDS)