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book (11)


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Guide to electronic measurements and laboratory practice
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ISBN: 0133695875 Year: 1973 Publisher: Englewood Cliffs, N.J. Prentice-Hall

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Silicon processing for the VLSI era. 3 : The submicron MOSFET.
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ISBN: 0961672153 Year: 1995 Publisher: Sunset Beach Lattice press

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Silicon processing for the VLSI era. 4: Deep-submicron process technology.
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ISBN: 096167217X Year: 2002 Publisher: Sunset Beach Lattice press

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Microchip manufacturing.
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ISBN: 0961672188 Year: 2004 Publisher: Sunset Beach Lattice press

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Silicon processing for the VLSI era. 2 : Process integration.
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ISBN: 0961672145 Year: 1990 Publisher: Sunset Beach Lattice press

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Nondestructive evaluation : Proceedings of a symposium sponsored by the Physical Metallurgy Committee of the Metallurgical society of AIME and the Energy and Resources Activity of the American Society for Metals at the TMS Fall Meeting, Pittsburgh, Pennsylvania, October 5-9, 1980 Microstructural characterization and reliability strategies
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ISBN: 0895203758 Year: 1981 Publisher: New York, NY : A.I.M.E. (American Institute of Mining and Metallurgical Engineers = American Institute of Mining, Metallurgical and Petroleum Engineers),

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Silicon processing for the VLSI era. 1 : Process technology.
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ISBN: 0961672137 Year: 1986 Publisher: Sunset Beach Lattice press

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Silicon processing for the VLSI era
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ISBN: 0961672161 Year: 2000 Publisher: Sunset Beach, Calif. : Lattice Press,

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Student reference manual for electronic instrumentation laboratories.
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ISBN: 0130421820 Year: 2004 Publisher: Upper Saddle River : Pearson Education,

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Nondestructive evaluation : application to materials processing : proceedings of a symposium
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ISBN: 0871701901 Year: 1984 Publisher: [Cleveland, Ohio] : American Society for Metals,

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