Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master qu

Systems on a chip --- Integrated circuits --- Testing. --- Very large scale integration --- Design. --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- SOC design --- Systems on chip --- Electronic circuits --- Microelectronics --- Embedded computer systems

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an ""adjacent"" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book.Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verific

Electronic circuit design --- Computer-aided design. --- Data processing. --- CAD (Computer-aided design) --- Computer-assisted design --- Computer-aided engineering --- Design

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.·

Integrated circuits --- Very large scale integration --- Design. --- Testing.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes.

Computer-aided design. --- Electronic circuit design --- Data processing.