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Volume 32 of Reviews in Mineralogy introduces the basic concepts of melt physics and relaxation theory as applied to silicate melts, then to describe the current state of experimental and computer simulation techniques for exploring the detailed atomic structure and dynamic processes which occur at high temperature, and finally to consider the relationships between melt structure, thermodynamic properties and rheology within these liquids. These fundamental relations serve to bridge the extrapolation from often highly simplified melt compositions studied in the laboratory to the multicomponent systems found in nature. This volume focuses on the properties of simple model silicate systems, which are usually volatile-free. The behavior of natural magmas has been summarized in a previous Short Course volume (Nicholls and Russell, editors, 1990: Reviews in Mineralogy, Vol. 24), and the effect of volatiles on magmatic properties in yet another (Carroll and Holloway, editors, 1994: Vol. 30). The Mineralogical Society of America sponsored a short course for which this was the text at Stanford University December 9 and 10, 1995, preceding the Fall Meeting of the American Geophysical Union and MSA in San Fransisco, with about 100 professionals and graduate students in attendance.

Silicates. --- Silicate minerals. --- Glass. --- Magmatism.

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Pure sciences. Natural sciences (general)

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Spectroscopic Methods in Mineralogy and Material Science covers significant advances in the technological aspects and applications of spectroscopic and microscopic techniques used in the Earth and Materials Sciences. The current volume compliments the now classic Volume 18, Spectroscopic Methods in Mineralogy and Geology, which became an essential resource to many scientists and educators for the past two decades. This volume updates techniques covered in Volume 18, and introduces new techniques available for probing the secrets of Earth materials, such as X-ray Raman and Brillouin spectroscopy. Other important topics including Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) are also covered.

Mineralogy, Determinative. --- Spectrum analysis. --- Minerals --- Materials --- Materials science. --- Raman spectroscopy. --- X-ray spectroscopy. --- Infrared spectroscopy. --- Ultraviolet spectroscopy. --- Luminescence spectroscopy. --- Luminescence spectrometry --- Spectrometry, Luminescence --- Spectroscopy, Luminescence --- Spectrum analysis --- Luminescent probes --- Atomic spectroscopy --- Molecular spectroscopy --- Optical spectroscopy --- Infra-red spectrometry --- Infrared spectrometry --- Spectrometry, Infrared --- Spectroscopy, Infrared --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- XES (X-ray emission spectroscopy) --- CARS spectroscopy --- Coherent anti-Stokes Raman spectroscopy --- Spectroscopy, Raman --- Material science --- Physical sciences --- Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Mineralogy --- Mines and mineral resources --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Chemical geology --- Determinative mineralogy --- Geology, Chemical --- Geochemistry --- Metallurgical analysis --- Prospecting --- Spectra. --- Qualitative --- Analytical chemistry --- mineralogy, geochemistry, petrology, vulcanology, material science, minearl physics, material physics.

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Engineering sciences. Technology