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Secondary ion mass spectrometry SIMS V : proceedings of the fifth international conference, Washington, D.C., September 30-October 4, 1985.
Authors: Benninghoven, A. --- Colton, Richard J. --- Simons, David S. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 3540162631 0387162631 3642827268 3642827241 9780387162638 Year: 1986 Volume: 44 Publisher: Berlin : Springer,

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Abstract

Keywords
Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

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