Abstract | Keywords | Export | Availability | Bookmark

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.

X-ray scattering --- Coded-aperture imaging --- Talbot-Interferometer --- Moiré pattern analysis --- Electron Backscatter imaging --- Dark-field imaging --- Computed Tomography --- cultural heritage --- X-ray Phase-contrast imaging --- medical imaging --- image processing: Fourier image analysis