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This book presents an overview of the field of 3D IC design, with an emphasis on electronic design automation (EDA) tools and algorithms that can enable the adoption of 3D ICs, and the architectural implementation and potential for future 3D system design. The aim of this book is to provide the reader with a complete understanding of: the promise of 3D ICs in building novel systems that enable the chip industry to continue along the path of performance scaling, the state of the art in fabrication technologies for 3D integration, the most prominent 3D-specific EDA challenges, along with solutions and best practices, the architectural benefits of using 3D technology, architectural-and system-level design issues, and the cost implications of 3D IC design. Three Dimensional Integrated Circuit Design: EDA, Design and Microarchitectures is intended for practitioners in the field, researchers and graduate students seeking to know more about 3D IC design.
Integrated circuits --Design and construction. --- Integrated circuits --- Microelectronics. --- Design and construction. --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Engineering. --- Electronics. --- Optical materials. --- Electronic materials. --- Materials --- Thin films. --- Electronics and Microelectronics, Instrumentation. --- Optical and Electronic Materials. --- Surfaces and Interfaces, Thin Films. --- Engineering, general. --- Surfaces. --- Electronics --- Microtechnology --- Semiconductors --- Miniature electronic equipment --- Surfaces (Physics). --- Construction --- Industrial arts --- Technology --- Physics --- Surface chemistry --- Surfaces (Technology) --- Optics --- Electrical engineering --- Physical sciences --- Materials—Surfaces. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Electronic materials --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Surfaces
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Statistical timing analysis is an area of growing importance in nanometer te- nologies‚ as the uncertainties associated with process and environmental var- tions increase‚ and this chapter has captured some of the major efforts in this area. This remains a very active field of research‚ and there is likely to be a great deal of new research to be found in conferences and journals after this book is published. In addition to the statistical analysis of combinational circuits‚ a good deal of work has been carried out in analyzing the effect of variations on clock skew. Although we will not treat this subject in this book‚ the reader is referred to [LNPS00‚ HN01‚ JH01‚ ABZ03a] for details. 7 TIMING ANALYSIS FOR SEQUENTIAL CIRCUITS 7.1 INTRODUCTION A general sequential circuit is a network of computational nodes (gates) and memory elements (registers). The computational nodes may be conceptualized as being clustered together in an acyclic network of gates that forms a c- binational logic circuit. A cyclic path in the direction of signal propagation 1 is permitted in the sequential circuit only if it contains at least one register . In general, it is possible to represent any sequential circuit in terms of the schematic shown in Figure 7.1, which has I inputs, O outputs and M registers. The registers outputs feed into the combinational logic which, in turn, feeds the register inputs. Thus, the combinational logic has I + M inputs and O + M outputs.
Engineering. --- Computer-aided engineering. --- Electrical engineering. --- Electronic circuits. --- Circuits and Systems. --- Electrical Engineering. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Systems engineering. --- Computer engineering. --- Computer aided design. --- CAE --- Engineering --- Electric engineering --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Data processing --- Timing circuits --- Integrated circuits --- Time-series analysis --- Computer-aided design. --- Very large scale integration --- Data processing. --- Electronic circuits --- Time measurements
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .
Electronic circuits. --- Microprocessors. --- Circuits and Systems. --- Electronic Circuits and Devices. --- Processor Architectures.
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .
Electronic circuits. --- Microprocessors. --- Circuits and Systems. --- Electronic Circuits and Devices. --- Processor Architectures.
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .
Electronic circuits. --- Microprocessors. --- Circuits and Systems. --- Electronic Circuits and Devices. --- Processor Architectures.
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This book serves both as an introduction to computer architecture and as a guide to using a hardware description language (HDL) to design, model and simulate real digital systems. The book starts with an introduction to Verilog - the HDL chosen for the book since it is widely used in industry and straightforward to learn. Next, the instruction set architecture (ISA) for the simple VeSPA (Very Small Processor Architecture) processor is defined - this is a real working device that has been built and tested at the University of Minnesota by the authors. The VeSPA ISA is used throughout the remainder of the book to demonstrate how behavioural and structural models can be developed and intermingled in Verilog. Although Verilog is used throughout, the lessons learned will be equally applicable to other HDLs. Written for senior and graduate students, this book is also an ideal introduction to Verilog for practising engineers.
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With the dramatic increases in on-chip packing densities, routing congestion has become a major problem in chip design. The problem is especially acute as interconnects are also the performance bottleneck in integrated circuits. The solution lies in judicious resource management. This involves intelligent allocation of the available interconnect resources, up-front planning of the wire routes for even wire distributions, and transformations that make the physical synthesis flow congestion-aware. Routing Congestion in VLSI Circuits: Estimation and Optimization provides the reader with a complete understanding of the root causes of routing congestion in present-day and future VLSI circuits, available techniques for estimating and optimizing this congestion, and a critical analysis of the accuracy and effectiveness of these techniques, so that the reader may prudently choose an approach that is appropriate to their design goals. The scope of the work includes metrics and optimization techniques for routing congestion at various stages of the VLSI design flow, including the architectural level, the logic synthesis/technology mapping level, the placement phase, and the routing step. A particular focus of this work is on the congestion issues that deal primarily with standard cell based design. Routing Congestion in VLSI Circuits: Estimation and Optimization is a valuable reference for CAD developers and researchers, design methodology engineers, VLSI design and CAD students, and VLSI design engineers.
Integrated circuits --- Routing (Computer network management) --- Very large scale integration. --- Computer networks --- Very large scale integration of circuits --- VLSI circuits --- Management --- Systems engineering. --- Computer aided design. --- Telecommunication. --- Circuits and Systems. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Communications Engineering, Networks. --- Electric communication --- Mass communication --- Telecom --- Telecommunication industry --- Telecommunications --- Communication --- Information theory --- Telecommuting --- CAD (Computer-aided design) --- Computer-assisted design --- Computer-aided engineering --- Design --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design and construction --- Electronic circuits. --- Computer-aided engineering. --- Electrical engineering. --- Electric engineering --- CAE --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Data processing
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Metal oxide semiconductors, Complementary --- Electrodiffusion --- Nanoelectromechanical systems --- Nano-electro-mechanical systems --- Nanoelectromechanical devices --- Nanomechanical devices --- Nanomechanical machines --- Nanomechanical systems --- Nanometer scale devices --- Nanoscale devices --- Nanoscale electronic devices --- Nanostructured devices --- NEMS (Nanotechnology) --- Electromechanical devices --- Nanoelectronics --- Nanostructures --- Electromigration --- Electrotransport --- Diffusion --- Physical metallurgy --- Transport theory --- CMOS (Electronics) --- Complementary metal oxide semiconductors --- Semiconductors, Complementary metal oxide --- Digital electronics --- Logic circuits --- Transistor-transistor logic circuits
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