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Book
Three-dimensional integrated circuit design : EDA, design and microarchitectures
Authors: --- ---
ISBN: 1441907831 1441907858 1461425131 144190784X 9786612838132 128283813X Year: 2010 Publisher: New York : Springer Science,

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This book presents an overview of the field of 3D IC design, with an emphasis on electronic design automation (EDA) tools and algorithms that can enable the adoption of 3D ICs, and the architectural implementation and potential for future 3D system design. The aim of this book is to provide the reader with a complete understanding of: the promise of 3D ICs in building novel systems that enable the chip industry to continue along the path of performance scaling, the state of the art in fabrication technologies for 3D integration, the most prominent 3D-specific EDA challenges, along with solutions and best practices, the architectural benefits of using 3D technology, architectural-and system-level design issues, and the cost implications of 3D IC design. Three Dimensional Integrated Circuit Design: EDA, Design and Microarchitectures is intended for practitioners in the field, researchers and graduate students seeking to know more about 3D IC design.

Timing
Authors: ---
ISBN: 1402076711 1402080220 Year: 2004 Publisher: New York : Kluwer Academic Publishers,

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Statistical timing analysis is an area of growing importance in nanometer te- nologies‚ as the uncertainties associated with process and environmental var- tions increase‚ and this chapter has captured some of the major efforts in this area. This remains a very active field of research‚ and there is likely to be a great deal of new research to be found in conferences and journals after this book is published. In addition to the statistical analysis of combinational circuits‚ a good deal of work has been carried out in analyzing the effect of variations on clock skew. Although we will not treat this subject in this book‚ the reader is referred to [LNPS00‚ HN01‚ JH01‚ ABZ03a] for details. 7 TIMING ANALYSIS FOR SEQUENTIAL CIRCUITS 7.1 INTRODUCTION A general sequential circuit is a network of computational nodes (gates) and memory elements (registers). The computational nodes may be conceptualized as being clustered together in an acyclic network of gates that forms a c- binational logic circuit. A cyclic path in the direction of signal propagation 1 is permitted in the sequential circuit only if it contains at least one register . In general, it is possible to represent any sequential circuit in terms of the schematic shown in Figure 7.1, which has I inputs, O outputs and M registers. The registers outputs feed into the combinational logic which, in turn, feeds the register inputs. Thus, the combinational logic has I + M inputs and O + M outputs.


Digital
Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Authors: --- ---
ISBN: 9783319488998 Year: 2017 Publisher: Cham Springer International Publishing

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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .


Book
Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Authors: --- ---
Year: 2017 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .


Book
Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Authors: --- ---
Year: 2017 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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Abstract

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .


Book
Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Authors: --- ---
Year: 2017 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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Abstract

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .


Book
Designing digital computing systems with Verilog
Authors: ---
ISBN: 1107160316 1280749628 9786610749621 0511262477 0511264860 0511265581 0511263287 0511331606 0511607059 0511264097 Year: 2005 Publisher: Cambridge ; New York : Cambridge University Press,

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This book serves both as an introduction to computer architecture and as a guide to using a hardware description language (HDL) to design, model and simulate real digital systems. The book starts with an introduction to Verilog - the HDL chosen for the book since it is widely used in industry and straightforward to learn. Next, the instruction set architecture (ISA) for the simple VeSPA (Very Small Processor Architecture) processor is defined - this is a real working device that has been built and tested at the University of Minnesota by the authors. The VeSPA ISA is used throughout the remainder of the book to demonstrate how behavioural and structural models can be developed and intermingled in Verilog. Although Verilog is used throughout, the lessons learned will be equally applicable to other HDLs. Written for senior and graduate students, this book is also an ideal introduction to Verilog for practising engineers.

Design automation for timing-driven layout synthesis
Authors: ---
ISBN: 0792392817 Year: 1993 Publisher: Boston : Kluwer Academic Publishers,

Routing congestion in VLSI circuits : estimation and optimization
Authors: --- ---
ISBN: 1280852453 9786610852451 0387485503 0387300376 1441940138 Year: 2007 Publisher: New York ; [London] : Springer,

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With the dramatic increases in on-chip packing densities, routing congestion has become a major problem in chip design. The problem is especially acute as interconnects are also the performance bottleneck in integrated circuits. The solution lies in judicious resource management. This involves intelligent allocation of the available interconnect resources, up-front planning of the wire routes for even wire distributions, and transformations that make the physical synthesis flow congestion-aware. Routing Congestion in VLSI Circuits: Estimation and Optimization provides the reader with a complete understanding of the root causes of routing congestion in present-day and future VLSI circuits, available techniques for estimating and optimizing this congestion, and a critical analysis of the accuracy and effectiveness of these techniques, so that the reader may prudently choose an approach that is appropriate to their design goals. The scope of the work includes metrics and optimization techniques for routing congestion at various stages of the VLSI design flow, including the architectural level, the logic synthesis/technology mapping level, the placement phase, and the routing step. A particular focus of this work is on the congestion issues that deal primarily with standard cell based design. Routing Congestion in VLSI Circuits: Estimation and Optimization is a valuable reference for CAD developers and researchers, design methodology engineers, VLSI design and CAD students, and VLSI design engineers.

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