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Fault-tolerance techniques for SRAM-based FPGAs
Authors: --- ---
ISBN: 1280624000 9786610624003 038731069X 0387310681 1441940529 Year: 2006 Volume: 32 Publisher: Dordrecht : Springer,

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Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications.

Radiation effects on embedded systems
Authors: --- ---
ISBN: 1280943661 9786610943661 140205646X 1402056451 9048174171 9781402056451 Year: 2007 Publisher: Dordrecht : Springer,

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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Keywords

Embedded computer systems. --- Integrated circuits --- Effect of radiation on. --- Integrated circuits, Effect of radiation on --- Radiation --- Embedded systems (Computer systems) --- Computer systems --- Architecture Analysis and Design Language --- Systems engineering. --- Environmental protection. --- Computer engineering. --- Electronics. --- Circuits and Systems. --- Effects of Radiation/Radiation Protection. --- Electrical Engineering. --- Electronics and Microelectronics, Instrumentation. --- Nuclear Energy. --- Electrical engineering --- Physical sciences --- Computers --- Environmental quality management --- Protection of environment --- Environmental sciences --- Applied ecology --- Environmental engineering --- Environmental policy --- Environmental quality --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design and construction --- Embedded computer systems --- Effect of radiation on --- Electronic circuits. --- Radiation protection. --- Radiation—Safety measures. --- Electrical engineering. --- Microelectronics. --- Nuclear energy. --- Atomic energy --- Atomic power --- Energy, Atomic --- Energy, Nuclear --- Nuclear power --- Power, Atomic --- Power, Nuclear --- Force and energy --- Nuclear physics --- Power resources --- Nuclear engineering --- Nuclear facilities --- Nuclear power plants --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Electronics --- Microtechnology --- Semiconductors --- Miniature electronic equipment --- Electric engineering --- Radiation monitoring --- Radiation protection --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Integrated circuits - Effect of radiation on


Book
VLSI-SoC : advanced topics on systems on a chip : IFIP TC 10/WG 10.5 and IEEE/CEDA : a selection of extended versions of the best papers of the Fourteenth International Conference on Very Large Scale Integration of Systems on Chip (VLSI-SoC2007), October 15-17, 2007, Atlanta, USA
Authors: --- ---
ISBN: 0387895574 0387895582 Year: 2009 Publisher: New York, New York : Springer,

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International Federation for Information Processing The IFIP series publishes state-of-the-art results in the sciences and technologies of information and communication. The scope of the series includes: foundations of computer science; software theory and practice; education; computer applications in technology; communication systems; systems modeling and optimization; information systems; computers and society; computer systems technology; security and protection in information processing systems; artificial intelligence; and human-computer interaction. Proceedings and post-proceedings of refereed international conferences in computer science and interdisciplinary fields are featured. These results often precede journal publication and represent the most current research. The principal aim of the IFIP series is to encourage education and the dissemination and exchange of information about all aspects of computing. For more information about the 300 other books in the IFIP series, please visit www.springer.com. For more information about IFIP, please visit www.ifip.org.


Book
Protecting chips against hold time violations due to variability
Authors: --- ---
ISBN: 9400724268 9400724276 Year: 2014 Publisher: New York : Springer,

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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements.  The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement circuit with a precision compatible to the speed of the technology is described.  ·         Provides a comprehensive review of various reliability mechanisms; ·         Describes practical modeling and characterization techniques for reliability ·         Includes thorough presentation of robust design techniques for major VLSI design units ·         Promotes physical understanding with first-principle simulations.


Book
15th Symposium on Integrated Circuits and Systems Design : proceedings : 9-14 September, 2002, Porto Alegre, Brazil
Authors: --- --- ---
Year: 2002 Publisher: [Place of publication not identified] IEEE Computer Society

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Book
15th Symposium on Integrated Circuits and Systems Design : proceedings : 9-14 September, 2002, Porto Alegre, Brazil
Authors: --- --- ---
Year: 2002 Publisher: [Place of publication not identified] IEEE Computer Society

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Book
Vlsi-soc: research trends in vlsi and systems on chip : fourteenth international conference on very large scale integration of system on chip (vlsi-soc2006), october 16-18, 2006, nice, france
Authors: --- --- ---
ISBN: 9780387749082 038774908X 0387749098 Year: 2008 Publisher: New York, New York : Springer,

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International Federation for Information Processing The IFIP series publishes state-of-the-art results in the sciences and technologies of information and communication. The scope of the series includes: foundations of computer science; software theory and practice; education; computer applications in technology; communication systems; systems modeling and optimization; information systems; computers and society; computer systems technology; security and protection in information processing systems; artificial intelligence; and human-computer interaction. Proceedings and post-proceedings of referred international conferences in computer science and interdisciplinary fields are featured. These results often precede journal publication and represent the most current research. The principal aim of the IFIP series is to encourage education and the dissemination and exchange of information about all aspects of computing. For more information about the 300 other books in the IFIP series, please visit www.springer.com. For more information about IFIP, please visit www.ifip.org.


Book
13th Symposium on Integrated Circuits and Systems Design : proceedings : 18-24 September 2000, Manaus, Brazil
Authors: --- --- --- ---
Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

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Book
13th Symposium on Integrated Circuits and Systems Design : proceedings : 18-24 September 2000, Manaus, Brazil
Authors: --- --- --- ---
Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

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