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Electron microprobe analysis and scanning electron microscopy in geology
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ISBN: 0521483506 0521482801 9780521483506 9780521482806 Year: 1996 Publisher: Cambridge : Cambridge University Press,


Book
Electron microprobe analysis
Author:
ISBN: 0521204666 Year: 1975 Publisher: Cambridge Cambridge University press

Electron microprobe analysis and scanning electron microscopy in geology
Author:
ISBN: 9780521848756 052184875X 9780511610561 9780521142304 Year: 2005 Publisher: Cambridge Cambridge University Press

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Abstract

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.


Book
Electron microprobe analysis
Author:
Year: 1975 Publisher: Cambridge Cambridge university press

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Book
Electron microprobe analysis and scanning electron microscopy in geology
Author:
ISBN: 1107153093 1280434961 9786610434961 051118235X 0511199805 0511300344 0511610564 0511125429 Year: 2005 Publisher: Cambridge ; New York : Cambridge University Press,

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Abstract

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

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