Union Catalogue of Belgian Libraries
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Book
Noise temperature measurements on wafer
Authors:
Randa, James.
---
United States.
Year: 1997
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Noise-temperature measurement system for the WR-28 Band
Authors:
Randa, James.
---
United States.
Year: 1997
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Uncertainties in NIST noises-temperature measurements
Authors:
Randa, James.
---
United States.
Year: 1998
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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A lattice approach to volumes irradiated by unknown sources
Authors:
Randa, James.
---
United States.
Year: 1986
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Book
Noise temperature measurements on wafer
Authors:
Randa, James.
---
United States.
Year: 1997
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Book
Uncertainties in NIST noises-temperature measurements
Authors:
Randa, James.
---
United States.
Year: 1998
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Book
A lattice approach to volumes irradiated by unknown sources
Authors:
Randa, James.
---
United States.
Year: 1986
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Book
Noise-temperature measurement system for the WR-28 Band
Authors:
Randa, James.
---
United States.
Year: 1997
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Book
Uncertainty analysis for NIST noise-parameter measurements
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Book
Recommended terminology for microwave radiometry
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