Narrow your search

Library

KU Leuven (7)

ULiège (7)

VDIC (6)

KBR (1)

UAntwerpen (1)


Resource type

book (13)


Language

English (13)


Year
From To Submit

2008 (4)

1998 (2)

1997 (4)

1986 (2)

1980 (1)

Listing 1 - 10 of 13 << page
of 2
>>
Sort by

Book
Noise temperature measurements on wafer
Authors: ---
Year: 1997 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Noise-temperature measurement system for the WR-28 Band
Authors: ---
Year: 1997 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Keywords


Book
Uncertainties in NIST noises-temperature measurements
Authors: ---
Year: 1998 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
A lattice approach to volumes irradiated by unknown sources
Authors: ---
Year: 1986 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Noise temperature measurements on wafer
Authors: ---
Year: 1997 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Uncertainties in NIST noises-temperature measurements
Authors: ---
Year: 1998 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
A lattice approach to volumes irradiated by unknown sources
Authors: ---
Year: 1986 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Noise-temperature measurement system for the WR-28 Band
Authors: ---
Year: 1997 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Keywords


Book
Uncertainty analysis for NIST noise-parameter measurements
Authors: ---
Year: 2008 Publisher: Boulder, CO : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Recommended terminology for microwave radiometry
Authors: ---
Year: 2008 Publisher: Boulder, CO : U.S. Dept. of Commerce, National Institute of Standards and Technology,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Listing 1 - 10 of 13 << page
of 2
>>
Sort by