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1974 (1)

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Advances in X-ray analysis
Authors: Pickles, William L. --- Ruud, Clayton O. --- Newkirk, John Burt
Year: 1975 Publisher: New York (N.Y.) : Plenum,

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Radiometry --- X-rays --- Industrial applications

Advances in X-ray analysis. 018. Volume 18 : [Proceedings of the twenty-third annual conference on applications of X-ray analysis held in Denver, August 7-9, 1974]
Authors: PICKLES, William L. --- BARRETT, Charles S. --- Newkirk, J. B. --- Ruud, C. O.
ISBN: 0306381184 Year: 1974 Publisher: New York, NY : Plenum Press,

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548.73 --- 548.73 X-ray analysis (Roentgen radiography) of crystals. X-ray investigation of properties. X-ray structure --- X-ray analysis (Roentgen radiography) of crystals. X-ray investigation of properties. X-ray structure --- Conferences - Meetings

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