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Secondary ion mass spectrometry SIMS IX : proceedings of the ninth international conference on secondary ion mass spectroscopy (SIMS IX), Yokohama, Japan, 7-12 November, 1993
Authors: Benninghoven, Alfred --- Nihei, Yoshimasa --- Shimizu, R. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 0471942189 Year: 1994 Publisher: Chichester : John Wiley,

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Abstract

Keywords
Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Congresses --- Congrès --- Spectrométrie de masse des ions secondaires --- Congrès --- Spectrométrie de masse des ions secondaires.

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