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Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.
Electronic apparatus and appliances -- Effect of radiation on. --- Integrated circuits -- Very large scale integration. --- Software failures. --- Soft errors (Computer science) --- Electronic systems --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Electronic systems. --- Systems, Electronic --- Engineering. --- Computer software --- Computer system failures. --- Electrical engineering. --- Electronic circuits. --- Circuits and Systems. --- System Performance and Evaluation. --- Performance and Reliability. --- Electrical Engineering. --- Reusability. --- Electronic apparatus and appliances --- Electronics --- Systems engineering. --- Computer system performance. --- Operating systems (Computers). --- Computer engineering. --- Computers --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Computer operating systems --- Disk operating systems --- Systems software --- Design and construction --- Operating systems --- Computer software—Reusability. --- Electric engineering --- Computer failures --- Computer malfunctions --- Computer systems --- Failure of computer systems --- System failures (Engineering) --- Fault-tolerant computing --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Failures
Choose an application
Choose an application
Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.
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