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Energy dispersive X-ray spectrometry in SEM.
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Year: 2004 Publisher: Gainesville Microscopy society of America

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Electron probe quantitation
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ISBN: 0306438240 Year: 1991 Publisher: New York (N.Y.): Plenum

Advanced scanning electron microscopy and X-ray microanalysis
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ISBN: 0306421402 1475790295 1475790279 9780306421402 Year: 1986 Publisher: New York (N.Y.) Plenum


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Fundamental electron and ion beam interactions with solids for microscopy, microanalysis and microlithography: proceedings of the Pfefferkorn Conference, held May 7-12, 1989, at Park City, Utah
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ISBN: 0931288460 Year: 1990 Publisher: Chicago, Ill. Scanning Microscopy International

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Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy : proceedings of a workshop, Gaithersburg, October 1-3, 1975
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Year: 1976 Publisher: Washington National bureau of standards

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Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy: proceedings ... October 1-3, 1975
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Year: 1976 Publisher: Washington United States department of Commerce

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Energy dispersive x-ray spectrometry
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Year: 1981 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Energy dispersive x-ray spectrometry
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Year: 1981 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists
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ISBN: 0306441756 1461276535 1461304911 9780306441752 Year: 1992 Publisher: New York, NY : Plenum Press,

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