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Book
New horizons of applied scanning electron microscopy
Authors: ---
ISBN: 3642031595 3642031617 9786612833472 3642031609 1282833472 Year: 2009 Publisher: Berlin ; New York : Springer Verlag,

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Abstract

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Keywords

Materials -- Microscopy. --- Scanning electron microscopy. --- X-ray microanalysis. --- Scanning electron microscopy --- Chemical & Materials Engineering --- Biology --- Microscopy --- Materials Science --- Engineering & Applied Sciences --- Health & Biological Sciences --- Technique --- Microscopy. --- Materials science. --- Solid state physics. --- Physical measurements. --- Measurement. --- Spectroscopy. --- Nanotechnology. --- Materials --- Thin films. --- Materials Science. --- Surfaces and Interfaces, Thin Films. --- Measurement Science and Instrumentation. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Nanotechnology and Microengineering. --- Surfaces. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Molecular technology --- Nanoscale technology --- High technology --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Physics --- Material science --- Physical sciences --- Surfaces --- Qualitative --- Electron microscopy


Book
New Horizons of Applied Scanning Electron Microscopy
Authors: --- ---
ISBN: 9783642031601 9783642031618 9783642261688 9783642031595 Year: 2010 Publisher: Berlin Heidelberg Springer Berlin Heidelberg

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Abstract

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.


Multi
New Horizons of Applied Scanning Electron Microscopy
Authors: --- ---
ISBN: 9783642031601 9783642031618 9783642261688 9783642031595 Year: 2010 Publisher: Berlin, Heidelberg Springer Berlin Heidelberg

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Bookmark

Abstract

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

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