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This book introduces techniques that advance the capabilities and strength of modern software tools for physical synthesis, with the ultimate goal to improve the quality of leading-edge semiconductor products.  It provides a comprehensive introduction to physical synthesis and takes the reader methodically from first principles through state-of-the-art optimizations used in cutting edge industrial tools. It explains how to integrate chip optimizations in novel ways to create powerful circuit transformations that help satisfy performance requirements. Broadens the scope of physical synthesis optimization to include accurate transformations operating between the global and local scales; Integrates groups of related transformations to break circular dependencies and increase the number of circuit elements that can be jointly optimized to escape local minima;  Derives several multi-objective optimizations from first observations through complete algorithms and experiments; Describes integrated optimization techniques that ensure a graceful timing closure process and impact nearly every aspect of a typical physical synthesis flow.

Cloning. --- Integrated circuits. --- Timing analysis. --- Integrated circuits --- Timing circuits --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Design and construction --- Timing circuits. --- Design and construction. --- Systems engineering. --- Electronics. --- Engineering. --- Circuits and Systems. --- Electronics and Microelectronics, Instrumentation. --- Nanotechnology and Microengineering. --- Electrical engineering --- Physical sciences --- Construction --- Industrial arts --- Technology --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Electronic circuits --- Time measurements --- Electronic circuits. --- Microelectronics. --- Nanotechnology. --- Molecular technology --- Nanoscale technology --- High technology --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Electronics --- Microtechnology --- Semiconductors --- Miniature electronic equipment --- Electron-tube circuits --- Electric circuits --- Electron tubes

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Recent progress in atomic physics, semiconductors, and optical technologies lead to the need to control matter at an unprecedented scale. However, atoms, electrons and photons do not obey laws of classical physics and instead are governed by quantum mechanics. The formalism of quantum circuits promises to transform engineering disciplines the way digital circuits transformed computing, communications, control and measurement. A quantum circuit simulator implemented in software acts as a replacement of an actual quantum system and seeks to calculate the output from the inputs. This is a very difficult task, but researchers have achieved significant progress in many important special cases. This self-contained book discusses both theoretical and practical aspects of simulating quantum circuits on conventional computers. Engineers can sanity-check and evaluate their designs through simulation before building hardware. Computer scientists can use simulation to compare quantum algorithms to conventional ones. Quantum Circuit Simulation covers the fundamentals of linear algebra and introduces basic concepts of quantum physics needed to understand quantum circuits and algorithms. It requires only basic familiarity with algebra, graph algorithms and computer engineering. After introducing necessary background, the authors describe key simulation techniques that have so far been scattered throughout the research literature in physics, computer science, and computer engineering. Quantum Circuit Simulation also illustrates the development of software for quantum simulation by example of the QuIDDPro package, which is freely available and can be used by students of quantum information as a "quantum calculator.".

Algebras, Linear. --- Quantum theory. --- Algebras, Linear --- Quantum theory --- Algebra --- Electrical Engineering --- Electrical & Computer Engineering --- Mathematics --- Physical Sciences & Mathematics --- Engineering & Applied Sciences --- Quantum computers. --- Integrated circuits --- Mathematical models. --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Engineering. --- Algorithms. --- Computer simulation. --- Applied mathematics. --- Engineering mathematics. --- Quantum physics. --- Spintronics. --- Electronic circuits. --- Circuits and Systems. --- Applications of Mathematics. --- Quantum Physics. --- Quantum Information Technology, Spintronics. --- Simulation and Modeling. --- Algorithm Analysis and Problem Complexity. --- Computers --- Electronic circuits --- Microelectronics --- Systems engineering. --- Mathematics. --- Computer software. --- Quantum dynamics --- Quantum mechanics --- Quantum physics --- Physics --- Mechanics --- Thermodynamics --- Math --- Science --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Software, Computer --- Computer systems --- Computer modeling --- Computer models --- Modeling, Computer --- Models, Computer --- Simulation, Computer --- Electromechanical analogies --- Mathematical models --- Simulation methods --- Model-integrated computing --- Design and construction --- Algorism --- Arithmetic --- Fluxtronics --- Magnetoelectronics --- Spin electronics --- Spinelectronics --- Nanotechnology --- Engineering analysis --- Mathematical analysis --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Foundations

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Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:   • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;   • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;   • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;   • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.

Engineering. --- Logic circuits -- Design. --- Logic circuits -- Testing. --- Uncertainty (Information theory). --- Logic circuits --- Uncertainty (Information theory) --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Design --- Testing --- Logic circuits. --- Measure of uncertainty (Information theory) --- Shannon's measure of uncertainty --- System uncertainty --- Circuits, Logic --- Systems engineering. --- Computer science. --- Computer hardware. --- Operating systems (Computers). --- Logic design. --- Algebra --- Circuits and Systems. --- Arithmetic and Logic Structures. --- Computer Hardware. --- Performance and Reliability. --- Logic Design. --- Symbolic and Algebraic Manipulation. --- Data processing. --- Design, Logic --- Design of logic systems --- Digital electronics --- Electronic circuit design --- Machine theory --- Switching theory --- Computer operating systems --- Computers --- Disk operating systems --- Systems software --- Informatics --- Science --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Operating systems --- Design and construction --- Information measurement --- Probabilities --- Questions and answers --- Electronic circuits --- Interface circuits --- Switching circuits --- Circuits --- Electronic circuits. --- Arithmetic and logic units, Computer. --- Computer software—Reusability. --- Computer science—Mathematics. --- Arithmetic and logic units, Computer --- Computer arithmetic --- Electronic digital computers --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics

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Complex analysis --- Quantum mechanics. Quantumfield theory --- Spectrometric and optical chemical analysis --- Electrical engineering --- Artificial intelligence. Robotics. Simulation. Graphics --- quantumfysica --- electron spin resonance spectre --- complexe analyse (wiskunde) --- vormgeving --- simulaties --- informatietechnologie --- elektrische circuits

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Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:   • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;   • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;   • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;   • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.

Mathematical logic --- Logic --- Algebra --- Mathematics --- Electrical engineering --- Applied physical engineering --- Production management --- Computer science --- Computer architecture. Operating systems --- algebra --- betrouwbaarheid --- computers --- informatica --- ontwerpen --- hardware --- OS (operating system) --- ingenieurswetenschappen --- logica --- computerkunde --- elektrische circuits