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Book
La Floride
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Year: 1844 Publisher: Bruxelles C. Muquardt

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Les deux Bassompierre
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Year: 1844 Publisher: Bruxelles

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Codigos de Chile
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Year: 1920

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Codigos de Chile. 2do. Apendice General
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Year: 1927

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La Floride.
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Year: 1856 Publisher: Paris De Vresse

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Scènes de la vie italienne
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Year: 1837 Publisher: Bruxelles Société générale d'imprimerie et de librairie

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84 (Méry) --- 84-31


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Les nuits espagnoles
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Year: 1853 Publisher: Paris [s.n.]

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Salons et souterrains
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Year: 1851 Publisher: Bruxelles Tarride

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Book
Computer Vision for X-Ray Testing : Imaging, Systems, Image Databases, and Algorithms
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ISBN: 9783319207476 3319207466 9783319207469 3319207474 Year: 2015 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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This accessible textbook presents an introduction to computer vision algorithms for industrially-relevant applications of X-ray testing.  Covering complex topics in an easy-to-understand way, without requiring any prior knowledge in the field, the book provides a concise review of the key methodologies in computer vision for solving important problems in industrial radiology. The theoretical coverage is supported by numerous examples, each of which can be tested and evaluated by the reader using a freely-available Matlab toolbox and X-ray image database. Topics and features: Introduces the mathematical background for monocular and multiple view geometry, which is commonly used in X-ray computer vision systems Describes the main techniques for image processing used in X-ray testing, including image filtering, edge detection, image segmentation and image restoration Presents a range of different representations for X-ray images, explaining how these enable new features to be extracted from the original image Examines a range of known X-ray image classifiers and classification strategies, and techniques for estimating the accuracy of a classifier Discusses some basic concepts for the simulation of X-ray images, and presents simple geometric and imaging models that can be used in the simulation Reviews a variety of applications for X-ray testing, from industrial inspection and baggage screening to the quality control of natural products Provides supporting material at an associated website, including a database of X-ray images and a Matlab toolbox for use with the book’s many examples This classroom-tested and hands-on guide is ideal for graduate and advanced undergraduate students interested in the practical application of image processing, pattern recognition and computer vision techniques for non-destructive quality testing and security inspection.

Keywords

Computer Science. --- Image Processing and Computer Vision. --- Quality Control, Reliability, Safety and Risk. --- Pattern Recognition. --- Computer science. --- Computer vision. --- Optical pattern recognition. --- System safety. --- Informatique --- Vision par ordinateur --- Reconnaissance optique des formes (Informatique) --- Sécurité des systèmes --- Applied Physics --- Engineering & Applied Sciences --- Image processing. --- Pattern recognition. --- Quality control. --- Reliability. --- Industrial safety. --- Safety, System --- Safety of systems --- Systems safety --- Accidents --- Industrial safety --- Systems engineering --- Machine vision --- Vision, Computer --- Artificial intelligence --- Image processing --- Pattern recognition systems --- Optical data processing --- Pattern perception --- Perceptrons --- Visual discrimination --- Prevention --- Optical data processing. --- Design perception --- Pattern recognition --- Form perception --- Perception --- Figure-ground perception --- Industrial accidents --- Industries --- Job safety --- Occupational hazards, Prevention of --- Occupational health and safety --- Occupational safety and health --- Prevention of industrial accidents --- Prevention of occupational hazards --- Safety, Industrial --- Safety engineering --- Safety measures --- Safety of workers --- System safety --- Dependability --- Trustworthiness --- Conduct of life --- Factory management --- Industrial engineering --- Reliability (Engineering) --- Sampling (Statistics) --- Standardization --- Quality assurance --- Quality of products --- Optical computing --- Visual data processing --- Bionics --- Electronic data processing --- Integrated optics --- Photonics --- Computers --- Optical equipment

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