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Book
OCM 2017 : 3rd International Conference on Optical Characterization of Materials : March 22nd - 23rd, 2017, Karlsruhe, Germany : Conference Proceedings
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Year: 2017 Publisher: Karlsruhe : KIT Scientific Publishing,

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Abstract

Each material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.

Keywords

Imaging systems


Book
Forum Bildverarbeitung 2016
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Year: 2016 Publisher: Karlsruhe : KIT Scientific Publishing,

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Abstract

Bildverarbeitung spielt in vielen Bereichen der Technik zur schnellen und berührungslosen Datenerfassung eine Schlüsselrolle. Der vorliegende Tagungsband des "Forums Bildverarbeitung", das am 1. und 2. Dezember 2016 in Karlsruhe als Veranstaltung des Karlsruher Instituts für Technologie und des Fraunhofer-Instituts für Optronik, Systemtechnik und Bildauswertung stattfand, enthält die Aufsätze der eingegangenen Beiträge. Darin wird über aktuelle Trends und Lösungen der Bildverarbeitung berichtet. Image Processing plays an important role in many technical fields for a fast and contactless data acquisition. The proceedings at hand of the "Forum Bildverarbeitung", which took place on December 1 and 2, 2016 in Karlsruhe as event of the Karlsruhe Institute of Technology and the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation, contains the articles of the submitted contributions. They report on current trends and solutions of image processing.


Book
OCM 2019 - Optical Characterization of Materials : Conference Proceedings
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Year: 2019 Publisher: Germany : KIT Scientific Publishing,

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Abstract

The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

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