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KU Leuven (5)

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book (5)

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2013 (2)

2012 (2)

2011 (1)

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ELFT-EFS Evaluation of Latent Fingerprint Technologies : Extended Feature Sets [evaluation #1]
Authors: Indovina, M. --- Hicklin, R. Austin. --- Kiebuzinski, George. --- National Institute of Standards and Technology (U.S.)
Year: 2011 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Evaluation of latent fingerprint technologies : extended feature sets [evaluation #2]
Authors: Indovina, M. --- Dvornychenko, V. --- Hicklin, R. Austin. --- Kiebuzinski, George. --- Information Technology Laboratory (National Institute of Standards and Technology).
Year: 2012 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Latent interoperability transmission specification
Authors: Chapman, Will. --- Hicklin, R. Austin. --- Kiebuzinski, George. --- Komarinski, Peter. --- Mayer-Splain, John. --- et al.
Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Fingerprints --- Forensic sciences. --- Palmprints --- Identification. --- Identification.

Book

Markup instructions for extended friction ridge features
Authors: Chapman, Will. --- Hicklin, R. Austin. --- Kiebuzinski, George. --- Komarinski, Peter. --- Mayer-Splain, John. --- et al.
Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Fingerprints --- Forensic sciences. --- Palmprints --- Identification.

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Extended Feature Set Profile Specification
Authors: Chapman, Will. --- Hicklin, R. Austin. --- Kiebuzinski, George. --- Komarinski, Peter. --- Mayer-Splain, John. --- et al.
Year: 2012 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Biometric identification. --- Fingerprints.

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