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Secondary ion mass spectrometry SIMS VIII : proceedings of the eight International Conference on Secondary Ion Mass Spectrometry (SIMS VIII), International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991
Authors: Benninghoven, Alfred --- Janssen, K. T. F. --- Tümpner, J. --- International conference on secondary ion mass spectrometry.
ISBN: 0471930644 Year: 1992 Publisher: Chichester : Wiley,

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Abstract

Keywords
Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires. --- Spectrométrie de masse des ions secondaires.

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