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Secondary ion mass spectrometry
Author: International Conference on Secondary Ion Mass Spectrometry
Publisher: Berlin

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Spectrometric and optical chemical analysis --- fysicochemie

Book

Sixth international conference on secondary ion mass spectrometry, September 13-18, 1987, Versailles : abstracts
Author: International conference on secondary ion mass spectrometry
Year: 1987 Publisher: Paris Société française du vide

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Secondary ion mass spectrometry SIMS XII: proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Universtié Catholique de Louvain, Brussels, Belgium, September 5-10,1999
Authors: Benninghoven, A. --- Bertrand, P. --- Migeon, H-N. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 0444503234 9780444503237 Year: 2000 Publisher: Amsterdam Elsevier

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Spectrometric and optical chemical analysis --- fysicochemie

Book

Secondary ion mass spectrometry SIMS IX : proceedings of the ninth international conference on secondary ion mass spectroscopy (SIMS IX), Yokohama, Japan, 7-12 November, 1993
Authors: Benninghoven, Alfred --- Nihei, Yoshimasa --- Shimizu, R. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 0471942189 Year: 1994 Publisher: Chichester : John Wiley,

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Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Congresses --- Congrès --- Spectrométrie de masse des ions secondaires --- Congrès --- Spectrométrie de masse des ions secondaires.

Book

Secondary ion mass spectrometry SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987
Authors: Benninghoven, Alfred --- Huber, A. M. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 0471918326 Year: 1988 Publisher: Chichester : John Wiley,

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Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Secondary ion mass spectroscopy --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

Book

Secondary ion mass spectrometry SIMS VIII : proceedings of the eight International Conference on Secondary Ion Mass Spectrometry (SIMS VIII), International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991
Authors: Benninghoven, Alfred --- Janssen, K. T. F. --- Tümpner, J. --- International conference on secondary ion mass spectrometry.
ISBN: 0471930644 Year: 1992 Publisher: Chichester : Wiley,

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Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires.

Book

Secondary ion mass spectrometry and related topics : SIMS XII : book of abstracts and program of the twelfth international conference, Université catholique de Louvain, Brussels, September 5-10, 1999
Author: International conference on secondary ion mass spectrometry and related topics (12th : 1999 : Brussels)
Year: 1999 Publisher: Brussels: Université catholique de Louvain,

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Secondary ion mass spectrometry SIMS XIII: proceedings of the 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001
Authors: Benninghoven, A. --- Nihei, Y. --- Kudo, M. --- International Conference on Secondary Ion Mass Spectrometry
Year: 2003 Publisher: New York Elsevier Science

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Spectrometric and optical chemical analysis --- fysicochemie

Secondary ion mass spectrometry SIMS XI : proceedings of the eleventh international conference on secondary ion mass spectrometry, Orlando, Florida, september 7-12th, 1997
Authors: Gillen, G. --- Lareau, Richard --- Bennett, Joe --- Stevie, F. A. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 0471978264 Year: 1998 Publisher: Chichester : John Wiley & Sons,

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Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires.

Secondary ion mass spectrometry SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981
Authors: Benninghoven, A. --- Giber, J. --- Laszlo, J. --- Riedel, M. --- Werner, H. W. --- et al.
ISBN: 354011372X 038711372X 3642881548 3642881521 Year: 1982 Volume: 19 Publisher: Berlin : Springer,

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Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

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