Narrow your search

Library

KU Leuven (22)

ULiège (22)

UGent (3)


Resource type

book (41)


Language

English (41)


Year
From To Submit

2009 (1)

2006 (1)

2005 (1)

2004 (4)

2003 (4)

More...
Listing 1 - 10 of 41 << page
of 5
>>
Sort by

Book
Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
Authors: --- ---
Year: 1993 Publisher: [Place of publication not identified] IEEE Computer Society Press

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
Authors: --- ---
Year: 1990 Publisher: [Place of publication not identified] IEEE Computer Society Press

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
Authors: --- ---
Year: 1990 Publisher: [Place of publication not identified] IEEE Computer Society Press


Book
Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
Authors: --- ---
Year: 1993 Publisher: [Place of publication not identified] IEEE Computer Society Press

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009
Authors: --- ---
ISBN: 0769535984 1509075674 9781509075676 Year: 2009 Publisher: [Place of publication not identified] IEEE Computer Society


Book
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
Authors: --- ---
Year: 1988 Publisher: [Place of publication not identified] Computer Society Press of the IEEE

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Proceedings International Test Conference 2002
Authors: --- ---
Year: 2002 Publisher: [Place of publication not identified] International Test Conference

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
Authors: --- ---
Year: 2001 Publisher: [Place of publication not identified] International Test Conference

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Authors: --- ---
Year: 2003 Publisher: [Place of publication not identified] International Test Conference

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
Authors: --- ---
Year: 2004 Publisher: [Place of publication not identified] IEEE

Loading...
Export citation

Choose an application

Bookmark

Abstract

Listing 1 - 10 of 41 << page
of 5
>>
Sort by